GENETIC DIVERGENCE AND SELECTION OF COMMON BEAN CULTIVARS BASED ON PLANT ARCHITECTURE AND GRAIN YIELD

-The characterization of genetic divergence in common bean cultivars for various traits related to plant architecture and grain yield is unprecedented. This study proposes to determine whether common bean cultivars of different grain types differ for 12 traits of plant architecture and grain yield; examine the correlations between these traits; analyze the genetic divergence of these cultivars; and select superior cultivars for these traits. A total of 22 common bean cultivars with the grains types most produced in Brazil were evaluated in two growing seasons. Plant architecture was analyzed based on 12 traits, and grain yield was determined at maturity. Significant genotype and genotype x environment interaction effects were obtained, indicating the existence of genetic variability for all evaluated traits. Several plant architecture traits were correlated, but none was highly correlated with grain yield. First-and second-internode lengths are more important in differentiating common bean cultivars. Principal component and Tocher's analyses resulted in the formation of four and seven groups of cultivars, respectively. Both methods are efficient in analyzing genetic divergence; however, Tocher's method is more informative. Cultivars BRS Campeiro, SCS 205 - Riqueza, BRS Esteio, IAC Imperador and Guapo Brilhante have a high grain yield potential, but only BRS Campeiro, BRS Esteio and Guapo Brilhante have upright plant architecture.