Ag-Sn bimetallic nanoparticles paste for high temperature service in power devices

被引:10
作者
Yu, Fuwen [1 ]
Wang, Kang [2 ]
Liu, Jiahao [1 ]
Fu, Xing [3 ]
Chen, Hongtao [1 ]
Li, Mingyu [1 ]
机构
[1] Harbin Inst Technol, Dept Mat Sci & Engn, Shenzhen 518055, Peoples R China
[2] China Elect Technol Grp Corp, Res Inst 54, Shijiazhuang 050081, Hebei, Peoples R China
[3] China Sci & Technol Reliabil Phys & Applicat Elec, Dept Reliabil Design Res, Guangzhou 510610, Peoples R China
关键词
die attach; nanoparticle; sintering; electrochemical migration; intermetallics; power device packaging; NANO-SILVER JOINTS; ELECTROCHEMICAL MIGRATION; MECHANICAL-PROPERTIES; BONDING STRENGTH; SOLDER ALLOYS; ELECTRONICS;
D O I
10.1088/1361-6528/ab92cd
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper, high strength Cu-Cu interconnections were achieved by sintering the paste of Ag-Sn bimetallic nanoparticles at low temperature. Compared with nano-Ag paste, the outer Sn coatings of the nano-Ag particles were found to be favorable for the densification of the bondline. The microstructures of Ag-Sn bimetallic nanoparticles and the bondlines under different sintereing conditions were studied in detail by x-ray photoelectron spectroscopy (XPS), x-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The Ag-Sn bimetallic nanoparticles bondline exhibit a high shear strength of 35.3 MPa and a low resistivity of 9.5 mu omega cm, when sintered at 260 degrees C for 20 min under a pressure of 0.5 MPa. The electrochemical migration time of this sintered Ag-Sn bimetallic nanoparticles was prolonged to be ten times of that of sintered nano-Ag. This bonding technology based on Ag-Sn bimetallic nanoparticles was a promising die attach method for high temperature power device packaging.
引用
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页数:13
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共 37 条
[21]   Joining of Silver Nanomaterials at Low Temperatures: Processes, Properties, and Applications [J].
Peng, Peng ;
Hu, Anming ;
Gerlich, Adrian P. ;
Zou, Guisheng ;
Liu, Lei ;
Zhou, Y. Norman .
ACS APPLIED MATERIALS & INTERFACES, 2015, 7 (23) :12597-12618
[22]   Mechanical properties of nano-silver joints as die attach materials [J].
Siow, Kim S. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2012, 514 :6-19
[23]   MEASUREMENT OF SHEET RESISTIVITIES WITH THE 4-POINT PROBE [J].
SMITS, FM .
BELL SYSTEM TECHNICAL JOURNAL, 1958, 37 (03) :711-718
[24]   Electrochemical migration tests of solder alloys in pure water [J].
Takemoto, T ;
Latanision, RM ;
Eagar, TW ;
Matsunawa, A .
CORROSION SCIENCE, 1997, 39 (08) :1415-1430
[25]   Controlling the microstructures from the gold-tin reaction [J].
Tsai, JY ;
Chang, CW ;
Shieh, YC ;
Hu, YC ;
Kao, CR .
JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (02) :182-187
[26]   Rapid pressureless low-temperature sintering of Ag nanoparticles for high-power density electronic packaging [J].
Wang, Shuai ;
Li, Mingyu ;
Ji, Hongjun ;
Wang, Chunqing .
SCRIPTA MATERIALIA, 2013, 69 (11-12) :789-792
[27]   High-Strength Pressure-Free Bonding Using Cu and Ni-Sn Nanoparticles [J].
Watanabe, Ryota ;
Ishizaki, Toshitaka .
PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, 2014, 31 (06) :699-705
[28]   Rapid sintering of nano-Ag paste at low current to bond large area (> 100 mm2) power chips for electronics packaging [J].
Xie, Yijing ;
Wang, Yanjie ;
Mei, Yunhui ;
Xie, Haining ;
Zhang, Kun ;
Feng, Shuangtao ;
Siow, Kim S. ;
Li, Xin ;
Lu, Guo-Quan .
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2018, 255 :644-649
[29]   Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device [J].
Yamada, Y. ;
Takaku, Y. ;
Yagi, Y. ;
Nakagawa, I. ;
Atsumi, T. ;
Shirai, M. ;
Ohnuma, I. ;
Ishida, K. .
MICROELECTRONICS RELIABILITY, 2007, 47 (12) :2147-2151
[30]   Pressureless bonding process using Ag nanoparticle paste for flexible electronics packaging [J].
Yan, Jianfeng ;
Zou, Guisheng ;
Wu, Ai-ping ;
Ren, Jialie ;
Yan, Jiuchun ;
Hu, Anming ;
Zhou, Y. .
SCRIPTA MATERIALIA, 2012, 66 (08) :582-585