A Radial-In-Plane Sensitivity Interferometer with Divergent Illumination for Displacement Measurement

被引:1
作者
Parra-Michel, Jorge R. [1 ]
Gutierrez-Hernandez, David [1 ]
Martinez-Pelaez, Rafael [1 ]
Escobar, Marco A. [1 ]
机构
[1] Univ La Salle Bajio, Fac Ingn Civil Mecan & Ind, Av Univ 602, Guanajuato 37150, Mexico
来源
APPLIED SCIENCES-BASEL | 2020年 / 10卷 / 03期
关键词
optical interferometer; displacement measurement; divergent illumination;
D O I
10.3390/app10030908
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
An in-plane radial sensitivity interferometer that uses the divergent illumination for displacement measurement in the radial direction is presented. A description and mathematical model for calculating the sensitivity vector are also presented. The interferometer has two polarizing filters: a circular one and a linear one to implement the phase stepping technique. A measurement of the radial deformation by thermal expansion is performed over an aluminium plate in order to test the interferometer. The results indicate that the maximum contribution of the out-of-plane with respect to the radial-in-plane sensitivity vector is less than 3% and decreases by less than 1% when measurements are performed near the optical axis. The measurement is compared with the results obtained by a finite element analysis on a virtual specimen model.
引用
收藏
页数:12
相关论文
共 23 条
  • [1] Albertazzi A, 2000, P INT CONG EXPERIT M, P108
  • [2] Assessment of NDT interferometric techniques for impact damage detection in composite laminates
    Ambu, R
    Aymerich, F
    Ginesu, F
    Priolo, P
    [J]. COMPOSITES SCIENCE AND TECHNOLOGY, 2006, 66 (02) : 199 - 205
  • [3] Arikawa S, 2007, J MAT TEST RES ASS J, V52, P176
  • [4] Vibration analysis and measurement for piezoceramic rectangular plates in resonance
    Chen, Chen-Pang
    Huang, Chi-Hung
    Chen, Yi-Yu
    [J]. JOURNAL OF SOUND AND VIBRATION, 2009, 326 (1-2) : 251 - 262
  • [5] Simultaneous measurement of whole in-plane displacement using phase-shifting ESPI
    Fan, H
    Wang, J
    Tan, YS
    [J]. OPTICS AND LASERS IN ENGINEERING, 1997, 28 (04) : 249 - 257
  • [6] Sensitivity errors in interferometric deformation metrology
    Farrant, DI
    Petzing, JN
    [J]. APPLIED OPTICS, 2003, 42 (28) : 5634 - 5641
  • [7] Polarization-shifting method for step interferometry
    Frins, EM
    Dultz, W
    Ferrari, JA
    [J]. PURE AND APPLIED OPTICS, 1998, 7 (01): : 53 - 60
  • [8] Hernández DAG, 2015, J OPTOELECTRON ADV M, V17, P216
  • [9] Achromatic phase shifting by a rotating polarizer
    Helen, SS
    Kothiyal, MP
    Sirohi, RS
    [J]. OPTICS COMMUNICATIONS, 1998, 154 (5-6) : 249 - 254
  • [10] Radial slope measurement of dynamic transparent samples
    Ignacio Serrano-Garcia, David
    Toto-Arellano, Noel-Ivan
    Martinez-Garcia, Amalia
    Rodriguez Zurita, Gustavo
    [J]. JOURNAL OF OPTICS, 2012, 14 (04)