Today's multifrequency instruments can rapidly and reliably detect all defects that can be found using eddy currents. Only good parts are used to calibrate the testers.
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Faculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, JapanFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan
Enokizono, Masato
Sikora, Ryszard
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Electrotechnical Institute, ul. Pozaryskiego 28, 04-703 Warszawa, PolandFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan
Sikora, Ryszard
Takeuchi, Kazuhiro
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Satobenec Inc., 1-7-1 Maizurumachi, Oita 870-8678, JapanFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan
Takeuchi, Kazuhiro
Kinoshita, Toshihiro
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Satobenec Inc., 1-7-1 Maizurumachi, Oita 870-8678, JapanFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan
机构:
Faculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, JapanFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan
Enokizono, Masato
Sikora, Ryszard
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Electrotechnical Institute, ul. Pozaryskiego 28, 04-703 Warszawa, PolandFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan
Sikora, Ryszard
Takeuchi, Kazuhiro
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Satobenec Inc., 1-7-1 Maizurumachi, Oita 870-8678, JapanFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan
Takeuchi, Kazuhiro
Kinoshita, Toshihiro
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Satobenec Inc., 1-7-1 Maizurumachi, Oita 870-8678, JapanFaculty of Engineering, Oita University, 700 Dannoharu, Oita 870-1192, Japan