Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes

被引：34

作者：

Kamimura, Osamu ^{[1
]}

Kawahara, Kota ^{[2
]}

Doi, Takahisa ^{[1
]}

Dobashi, Takashi ^{[1
]}

Abe, Takashi ^{[2
]}

Gohara, Kazutoshi ^{[2
]}

机构：

[1] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan

[2] Hokkaido Univ, Grad Sch Engn, Div Appl Phys, Sapporo, Hokkaido 0638628, Japan

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 02期

关键词：

D O I：

10.1063/1.2834372

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for radiation-sensitive materials. Fine, homogeneous, and isolated multiwall carbon nanotubes (MWCNTs) were used as specimens. To avoid lens aberrations, the diffraction patterns were recorded without a postspecimen lens. One- and two-dimensional iterative phase retrievals were executed. Images reconstructed from the diffraction pattern alone showed a characteristic structure of MWCNTs with the finest feature corresponding to a carbon wall spacing of 0.34 nm. (c) 2008 American Institute of Physics.

引用

页数：3

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