Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantification

被引：24

作者：

MacArthur, Katherine E. ^{[1
]}

Brown, Hamish G. ^{[2
]}

Findlay, Scott D. ^{[2
]}

Allen, Leslie J. ^{[1
,3
]}

机构：

[1] Forschungszentrum Julich, Peter Grunberg Inst, Ernst Ruska Ctr Microscopy & Spect Electrons, D-52425 Julich, Germany

[2] Monash Univ, Sch Phys & Astron, Clayton, Vic 3800, Australia

[3] Univ Melbourne, Sch Phys, Parkville, Vic 3010, Australia

来源：

ULTRAMICROSCOPY | 2017年 / 182卷

基金：

澳大利亚研究理事会;

关键词：

QUANTITATIVE-ANALYSIS; ABSORPTION CORRECTION; ABSOLUTE-SCALE; ZETA-FACTOR; NANOPARTICLES; SPECTROSCOPY; SILICON; TILT; TOMOGRAPHY; PROGRESS;

D O I：

10.1016/j.ultramic.2017.07.020

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Advances in microscope stability, aberration correction and detector design now make it readily possible to achieve atomic resolution energy dispersive X-ray mapping for dose resilient samples. These maps show impressive atomic-scale qualitative detail as to where the elements reside within a given sample. Unfortunately, while electron channelling is exploited to provide atomic resolution data, this very process makes the images rather more complex to interpret quantitatively than if no electron channelling occurred. Here we propose small sample tilt as a means for suppressing channelling and improving quantification of composition, whilst maintaining atomic-scale resolution. Only by knowing composition and thickness of the sample is it possible to determine the atomic configuration within each column. The effects of neighbouring atomic columns with differing composition and of residual channelling on our ability to extract exact column-by-column composition are also discussed. (C) 2017 Elsevier B.V. All rights reserved.

引用

页码：264 / 275

页数：12

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