Magnetic Czochralski silicon as detector material

被引:21
作者
Haerkoenen, J. [1 ]
Tuovinen, E. [1 ]
Luukka, P. [1 ]
Nordlund, H. K. [1 ]
Tuominen, E. [1 ]
机构
[1] CERN, PH, Helsinki Inst Phys, CH-1211 Geneva, Switzerland
关键词
particle detectors; radiation hardness; magnetic Czocbralski silicon;
D O I
10.1016/j.nima.2007.05.264
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The Czochralski silicon (Cz-Si) has intrinsically high oxygen concentration. Therefore Cz-Si is considered as a promising material for the tracking systems in future very high luminosity colliders. In this contribution a brief overview of the Czochralski crystal growth is given. The fabrication process issues of Cz-Si are discussed and the formation of thermal donors is especially emphasized. N+/p(-)/p(+) and p(+)/n(-)/n(+) detectors have been processed on magnetic Czochralski (MCz-Si) wafers. We show measurement data of AC-coupled strip detectors and single pad detectors as well as experimental results of intentional TD doping. Data of spatial homogeneity of electrical properties, full depletion voltage and leakage current, is shown and n and p-type devices are compared. Our results show that it is possible to manufacture high quality n(+)/p(-)/p(+) and p(+)/n(-)/n(+) particle detectors from high-resistivity Cz-Si. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:648 / 652
页数:5
相关论文
共 19 条
[1]  
[Anonymous], 2005, CERNLHCC2005037
[2]  
BRUZZI M, IN PRESS NUCL INSTR
[3]   Current trends in silicon defect technology [J].
Bullis, WM .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 72 (2-3) :93-98
[4]   First results on the charge collection properties of segmented detectors made with p-type bulk silicon [J].
Casse, G ;
Allport, PP ;
Bowcock, TJV ;
Greenall, A ;
Hanlon, M ;
Jackson, JN .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 487 (03) :465-470
[5]  
GIANNOTTI F, 2002, HEPPH0204087
[6]   Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (μPCD) technique [J].
Harkonen, J. ;
Tuovinen, E. ;
Li, Z. ;
Luukka, P. ;
Verbitskaya, E. ;
Eremin, V. .
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2006, 9 (1-3) :261-265
[7]   Proton irradiation results of p+/n-/n+ Cz-Si detectors processed on p-type boron-doped substrates with thermal donor-induced space charge sign inversion [J].
Härkönen, J ;
Tuovinen, E ;
Luukka, P ;
Kauppinen, L ;
Li, Z ;
Moll, M ;
Bates, A ;
Kaska, K .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 552 (1-2) :43-48
[8]   Processing and recombination lifetime characterization of silicon microstrip detectors [J].
Härkönen, J ;
Tuominen, E ;
Lassila-Perini, K ;
Palokangas, M ;
Yli-Koski, M ;
Ovchinnikov, V ;
Heikkilä, P ;
Palmu, L ;
Kallijärvi, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 485 (1-2) :159-165
[9]  
HARKONEN J, 2002, NUCL INSTRUM METH A, V65, DOI UNSP 085205
[10]  
HURLE DTJ, 1973, PHYS LETT A, V43