Growth-Direction Dependent Rapid-Melting-Growth of Ge-on-Insulator (GOI) and its Application to Ge Mesh-Growth

被引:2
作者
Yokoyama, H. [1 ]
Ohta, Y. [1 ]
Toko, K. [1 ]
Sadoh, T. [1 ]
Miyao, M. [1 ]
机构
[1] Kyushu Univ, Dept Elect, Nishi Ku, Fukuoka 8190395, Japan
来源
ADVANCED SEMICONDUCTOR-ON-INSULATOR TECHNOLOGY AND RELATED PHYSICS 15 | 2011年 / 35卷 / 05期
关键词
D O I
10.1149/1.3570777
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Single crystal Ge-on-insulator (GOI) structures with various crystal orientations are necessary for realization of advanced highspeed and multi-functional devices. SiGe mixing triggered rapid-melting-growth of GOI is investigated as a function of seed-orientations and growth-directions. Single crystal growth of (100)-Ge strips is possible for all growth directions using (100)-oriented Si-seeds. However, rotational-growth is observed for some directions when Si-seeds with (110) and (111) orientations are employed. Such rotational-growth is completely suppressed by selecting the growth-directions deviating from the < 111 > direction by more than 35 degrees. Based on this finding, growth of large mesh-patterned Ge layers with (100), (110), and (111) orientations are demonstrated.
引用
收藏
页码:55 / 60
页数:6
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