The different roles of charged and neutral atomic and molecular oxidising species in silicon oxidation from Ab initio calculations

被引:22
作者
Szymanski, MA
Stoneham, AM
Shluger, A
机构
[1] UCL, Dept Phys & Astron, London WC1E 6BT, England
[2] Warsaw Univ Technol, Fac Phys, PL-00662 Warsaw, Poland
关键词
silicon oxidation; SiO2; electron transfer; isotope exchange; DFT; oxygen diffusion;
D O I
10.1016/S0038-1101(00)00263-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We examine the roles of charged and neutral oxidising species based on extensive ab initio, DFT calculations. Six species are considered: interstitial atomic O, O-, O2- and Molecular species: O-2,O-2(-),O-2(2-). We calculate their incorporation energies into bulk silicon dioxide, vertical electron affinities and diffusion barriers. In our calculations, we assume that the electrons responsible for the change of charge state come from the silicon conduction band, however the generalisation to any other source of electrons is possible and hence our results are also relevant to electron-beam assisted and plasma oxidation. The calculations yield information about the relative stability of oxidising species, and the possible transformations between them and their charging patterns. We discuss the ability to exchange O atoms between the mobile species and the host lattice during diffusion, since this determines whether or not isotope exchange is expected. Our results show very clear trends: (1) molecular species are energetically preferable over atomic ones, (2) charged species are energetically more favourable than neutral ones, (3) diffusion of atomic species (O, O-, O2-) will result in oxygen exchange, whereas the diffusion of molecular species (O-2, O-2(-),O-2(2-)) is not likely to lead to significant exchange with the lattice. Our results show thermodynamic trends for oxidising species to capture electrons from Si during oxidation. We identify very different roles for atomic and molecular species and also for different charge states of those species. This points out to opportunities, usually not considered, for optimising thin oxide layers and interface properties for use in electronics devices. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1233 / 1240
页数:8
相关论文
共 26 条
[1]   The valence band alignment at ultrathin SiO2/Si interfaces [J].
Alay, JL ;
Hirose, M .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (03) :1606-1608
[2]   LOW-PRESSURE OXIDATION OF SILICON STIMULATED BY LOW-ENERGY ELECTRON-BOMBARDMENT [J].
COLLOT, P ;
GAUTHERIN, G ;
AGIUS, B ;
RIGO, S ;
ROCHET, F .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (06) :1051-1069
[3]   GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON [J].
DEAL, BE ;
GROVE, AS .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3770-&
[4]   HYSTERESIS AND FRANCK-CONDON RELAXATION IN INSULATOR-SEMICONDUCTOR TUNNELING [J].
FOWLER, WB ;
RUDRA, JK ;
ZVANUT, ME ;
FEIGL, FJ .
PHYSICAL REVIEW B, 1990, 41 (12) :8313-8317
[5]   EFFECT OF AN ELECTRIC FIELD ON SILICON OXIDATION [J].
JORGENSEN .
JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) :874-&
[6]   GROWTH AND MODELING OF CW-UV INDUCED OXIDATION OF SILICON [J].
KAZOR, A ;
BOYD, IW .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (01) :227-231
[7]   NOISE IN SOLID-STATE MICROSTRUCTURES - A NEW PERSPECTIVE ON INDIVIDUAL DEFECTS, INTERFACE STATES AND LOW-FREQUENCY (1/F) NOISE [J].
KIRTON, MJ ;
UREN, MJ .
ADVANCES IN PHYSICS, 1989, 38 (04) :367-468
[8]   Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set [J].
Kresse, G ;
Furthmuller, J .
PHYSICAL REVIEW B, 1996, 54 (16) :11169-11186
[9]   Efficiency of ab-initio total energy calculations for metals and semiconductors using a plane-wave basis set [J].
Kresse, G ;
Furthmuller, J .
COMPUTATIONAL MATERIALS SCIENCE, 1996, 6 (01) :15-50
[10]   Reduction of the interfacial Si displacement of ultrathin SiO2 on Si(100) formed by atmospheric-pressure ozone [J].
Kurokawa, A ;
Nakamura, K ;
Ichimura, S ;
Moon, DW .
APPLIED PHYSICS LETTERS, 2000, 76 (04) :493-495