Formation of metallic nanoclusters in oxygen deficient indium tin oxide films

被引:24
作者
Perriere, J. [1 ]
Hebert, C. [1 ]
Petitmangin, A. [1 ]
Portier, X. [2 ]
Seiler, W. [3 ]
Nistor, M. [4 ]
机构
[1] Univ Paris 06, CNRS, Inst Nanosci Paris INSP, UMR 7588, F-75252 Paris 05, France
[2] UCBN, ENSICAEN, CNRS, CIMAP,CEA,UMR 6252, F-14050 Caen, France
[3] Arts & Metiers ParisTech, CNRS, PIMM, UMR 8006, F-75013 Paris, France
[4] Natl Inst Lasers Plasmas & Radiat Phys, Plasma Phys & Nucl Fus Lab, Bucharest 77125, Romania
关键词
REAL-TIME EVOLUTION; THIN-FILMS; LASER-ABLATION; ELECTRICAL-PROPERTIES; ROOM-TEMPERATURE; CRYSTALLIZATION; RESISTIVITY; ITO;
D O I
10.1063/1.3596578
中图分类号
O59 [应用物理学];
学科分类号
摘要
The composition, structure, microstructure, and properties of indium tin oxide films grown by pulsed laser deposition at room temperature and under vacuum were studied. The films are highly nonstoichiometric, with about 20% oxygen deficiency, and present a semiconductor behavior between 300 and 15 K, followed by a superconducting transition at about 7 K related to the presence of In or In-Sn nanoclusters embedded in a stoichiometric indium tin oxide matrix, i.e., nanocomposite films are formed by the phase separation of oxygen deficient metastable indium tin oxide. The solid-liquid and liquid-solid phase transitions of the metallic nanoclusters were evidenced by resistivity measurements in the 300 to 450 K range. The films grown at room temperature are partially crystallized. Actually, stoichiometric indium tin oxide crystallites are observed in the as grown films. After thermal treatment (< 450 K), both stoichiometric indium tin oxide crystallites and the tetragonal phase of the metallic In are observed in the nanocomposite films. The size of nanoclusters (from 5 to 30 nm), which depends on the thermal treatments and crystallization, and the microstructure of the nanocomposite films were confirmed by HRTEM measurements. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3596578]
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页数:8
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