Study of the optical properties of amorphous As-Se-S thin films

被引:13
作者
Aly, Kamal A. [1 ,2 ]
Hegazy, H. H. [3 ]
Dahshan, A. [3 ,4 ]
Shaaban, Kh. S. [5 ]
Saddeek, Y. [2 ]
Alharbi, S. R. [6 ]
Ali, Atif Mossad [3 ,7 ]
Amin, S. A. [7 ]
机构
[1] Univ Jeddah, Fac Sci & Arts Khulais, Dept Phys, Khulais, Saudi Arabia
[2] Al Azhar Univ, Assiut branch, Dept Phys, Fac Sci, Assiut 71524, Egypt
[3] King Khalid Univ, Dept Phys, Fac Sci, POB 9004, Abha, Saudi Arabia
[4] Port Said Univ, Dept Phys, Fac Sci, Port Said, Egypt
[5] Al Azhar Univ, Assiut branch, Dept Chem, Fac Sci, Assiut, Egypt
[6] Univ Jeddah, Dept Phys, Fac Sci, Jeddah, Saudi Arabia
[7] Assiut Univ, Dept Phys, Fac Sci, Assiut, Egypt
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2018年 / 124卷 / 12期
关键词
CHALCOGENIDE GLASSES; CONSTANTS; GE; THICKNESS; GAP;
D O I
10.1007/s00339-018-2278-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This study investigates the effects of substitution of selenium by sulfur on the optical constants of amorphous (a-)As20Se80-xSx films (x=0, 4, 8, 12, 16, and 20at%), where the coordination number for both Se and S is the same. The absorption coefficient, , and the index of refraction, n, were derived using the transmission spectra in a wide range of wavelengths from 400 to 2500nm. This revealed that the index of refraction for the a-As20Se80-xSx system decreases with increase in sulfur content throughout the range under study. The effective coordination number of As has been determined based on the refractive index dispersion analysis. A decreasing in N-c from 4.022 to 3.752 with increase content of sulfur from 0 to 20at% has been recorded. In addition, the optical bandgap, E-g, of the a-As20Se80-xSx thin films increases with increase in S content which can be explicated in terms of the chemical bond approach.
引用
收藏
页数:8
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