Secondary-electron emission from a single-crystalline aluminum surface induced by multiply charged oxygen ions

被引：2
|
作者：
Karmakar, P
Agarwal, P
Nabhiraj, PY
Bose, DK
Bhandari, RK
Ghose, D
机构：
[1] Saha Inst Nucl Phys, Bidhan Nagar 700064, Kolkata, India
[2] Bhabha Atom Res Ctr, Ctr Variable Energy Cyclotron, Bidhan Nagar 700064, Kolkata, India
来源：
PHYSICAL REVIEW A | 2001年 / 64卷 / 03期
关键词：
D O I：
10.1103/PhysRevA.64.034901
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Total electron yields and the most probable electron energy have been measured for impact of Oq+ (q = 1-7) ions at near-normal incidence on a clean Al(110) single-crystal target. The projectile velocities were varied in the range from 0.08 a.u. to 0.6 a.u. The contributions from potential emission (PE) and kinetic emission (KE) to the total yields have been studied. The results support the procedure described by Hughes et al. [Phys. Rev. Lett. 71, 291 (1993)] for the separation of PE from the total electron yield where the KE contribution is more prominent.
引用
收藏
页码：1 / 3
页数：3
相关论文
共 50 条
  • [1] SECONDARY-ELECTRON SPECTRA FROM A TANTALUM SURFACE BY MULTIPLY CHARGED IONS
    KANIE, T
    ODA, K
    ICHIMIYA, A
    YASUE, T
    OHTANI, S
    TAWARA, H
    SURFACE SCIENCE, 1991, 242 (1-3) : 417 - 421
  • [2] INCIDENT ANGLE DEPENDENCE OF SECONDARY-ELECTRON EMISSION FROM A TA SURFACE BY MULTIPLY CHARGED IONS
    KANIE, T
    ICHIMIYA, A
    OHTANI, S
    TAWARA, H
    YASUE, T
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 67 (1-4): : 601 - 603
  • [3] SECONDARY-ELECTRON EMISSION FROM SURFACES IMPACTED BY MULTIPLY-CHARGED POLYATOMIC IONS
    AXELSSON, J
    REIMANN, CT
    SUNDQVIST, BUR
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 88 (1-2): : 131 - 137
  • [4] SECONDARY-ELECTRON EMISSION BY MULTIPLY CHARGED IONS AND ITS MAGNITUDE IN VACUUM ARCS
    SHERMAN, JC
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (03) : 355 - 359
  • [5] SECONDARY-ELECTRON EMISSION FROM ALUMINUM
    PILLON, J
    ROPTIN, D
    CAILLER, M
    SURFACE SCIENCE, 1976, 57 (02) : 741 - 748
  • [6] SECONDARY-ELECTRON EMISSION FROM A CHARGED DIELECTRIC
    BUDD, PA
    JAVIDI, B
    ROBINSON, JW
    IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1985, 20 (03): : 485 - 491
  • [7] Secondary-electron yield from Au induced by highly charged Ta ions
    Krása, J
    Láska, L
    Stöckli, MP
    Fry, D
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 173 (03): : 281 - 286
  • [8] ELECTRON-EMISSION INDUCED BY MULTIPLY CHARGED AR IONS IMPINGING ON A TUNGSTEN SURFACE
    DEZWART, ST
    DRENTJE, AG
    BOERS, AL
    MORGENSTERN, R
    SURFACE SCIENCE, 1989, 217 (1-2) : 298 - 316
  • [9] ELECTRON-EMISSION IN THE NEUTRALIZATION OF MULTIPLY-CHARGED IONS AT LOW VELOCITIES ON METAL-SURFACES - THE EFFECT OF SECONDARY-ELECTRON CASCADES
    LORENTE, N
    MONREAL, R
    MARAVALL, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 100 (2-3): : 290 - 295
  • [10] ELECTRON-EMISSION FROM THE INTERACTION OF MULTIPLY CHARGED IONS WITH A AU(110) SURFACE
    ZEHNER, DM
    OVERBURY, SH
    HAVENER, CC
    MEYER, FW
    HEILAND, W
    SURFACE SCIENCE, 1986, 178 (1-3) : 359 - 366
12345