Denoising of scanning electron microscope images for biological ultrastructure enhancement

被引:4
|
作者
Chang, Sheng [1 ,2 ]
Shen, Lijun [1 ]
Li, Linlin [1 ]
Chen, Xi [1 ]
Han, Hua [1 ,3 ,4 ,5 ]
机构
[1] Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
[2] Univ Chinese Acad Sci, Sch Artificial Intelligence, Beijing 100190, Peoples R China
[3] Univ Chinese Acad Sci, Sch Future Technol, Beijing 100190, Peoples R China
[4] Chinese Acad Sci, Ctr Excellence Brain Sci & Intelligence Technol, Shanghai 200031, Peoples R China
[5] CASIA, Natl Lab Pattern Recognit, Beijing 100190, Peoples R China
关键词
SEM; noise model; denoising; variance stabilization transformation; two-stage multi-loss; deep learning; NOISE REMOVAL; POISSON;
D O I
10.1142/S021972002250007X
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
Scanning electron microscopy (SEM) is of great significance for analyzing the ultrastructure. However, due to the requirements of data throughput and electron dose of biological samples in the imaging process, the SEM image of biological samples is often occupied by noise which severely affects the observation of ultrastructure. Therefore, it is necessary to analyze and establish a noise model of SEM and propose an effective denoising algorithm that can preserve the ultrastructure. We first investigated the noise source of SEM images and introduced a signal-related SEM noise model. Then, we validated the effectiveness of the noise model through experiments, which are designed with standard samples to reflect the relation between real signal intensity and noise. Based on the SEM noise model and traditional variance stabilization denoising strategy, we proposed a novel, two-stage denoising method. In the first stage variance stabilization, our VS-Net realizes the separation of signal-dependent noise and signal in the SEM image. In the second stage denoising, our D-Net employs the structure of U-Net and combines the attention mechanism to achieve efficient noise removal. Compared with other existing denoising methods for SEM images, our proposed method is more competitive in objective evaluation and visual effects. Source code is available on GitHub (https://github.com/VictorCSheng/VSID-Net).
引用
收藏
页数:21
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