Measuring magnetic excitations in microstructures using X-ray microscopy

被引:8
|
作者
Quitmann, C. [1 ]
Raabe, J. [1 ]
Buehler, C. [2 ]
Buess, M. [1 ]
Johnson, S. [1 ]
Nolting, F. [1 ]
Schlott, V. [1 ]
Streun, A. [1 ]
机构
[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[2] Novartis Inst BioMed Res GmbH & Co KG, Vienna, Austria
关键词
magnetic properties of thin films/nanostructures; dynamic properties; PEEM; time resolved;
D O I
10.1016/j.nima.2008.01.093
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We describe the imaging of magnetic excitation in microstructures with a photoemission electron microscope (PEEM) installed at an undulator beamline of the Swiss Light Source. The experiment uses a stroboscopic pump-probe-gate setup. A laser synchronized to the storage ring switches currents in a coplanar wave guide resulting in magnetic field pulses of 100 ps rise time and up to 80 Oe amplitude. We measure the spatial distribution of the magnetization M(r, At) using X-ray magnetic circular dichroism. The results allow quantitative analysis of the magnetization with better than 100 nm spatial resolution and provide information on the frequencies, shapes and the damping of magnetic eigenmodes. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:494 / 501
页数:8
相关论文
共 50 条
  • [1] Magnetic microstructures and their dynamics studied by X-ray microscopy
    Fischer, P
    Kim, DH
    Kang, B
    Chao, W
    Anderson, EH
    MICRON, 2006, 37 (04) : 296 - 300
  • [2] Studies of magnetic microstructures with soft X-ray transmission microscopy
    Fischer, P
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 2006, 42 (1-2) : 36 - 43
  • [3] Transmission X-ray microscopy using X-ray magnetic circular dichroism
    T. Eimüller
    P. Fischer
    M. Köhler
    M. Scholz
    P. Guttmann
    G. Denbeaux
    S. Glück
    G. Bayreuther
    G. Schmahl
    D. Attwood
    G. Schütz
    Applied Physics A, 2001, 73 : 697 - 701
  • [4] Transmission X-ray microscopy using X-ray magnetic circular dichroism
    Eimüller, T
    Fischer, P
    Köhler, M
    Scholz, M
    Guttmann, P
    Denbeaux, G
    Glück, S
    Bayreuther, G
    Schmahl, G
    Attwood, D
    Schütz, G
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 73 (06): : 697 - 701
  • [5] X-ray microscopy with X-ray Magnetic Circular Dichroism
    Fischer, P
    Schutz, G
    Schmahl, G
    Guttmann, P
    Raasch, D
    JOURNAL DE PHYSIQUE IV, 1997, 7 (C2): : 467 - 468
  • [6] X-ray diffraction microscopy of lithiated silicon microstructures
    Fister, Tim T.
    Goldman, Jason L.
    Long, Brandon R.
    Nuzzo, Ralph G.
    Gewirth, Andrew A.
    Fenter, Paul A.
    APPLIED PHYSICS LETTERS, 2013, 102 (13)
  • [7] Soft X-ray photoemission electron microscopy as an element-specific probe of magnetic microstructures
    Schneider, CM
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1997, 175 (1-2) : 160 - 176
  • [8] X-Ray Diffraction Microscopy of Magnetic Structures
    Turner, Joshua J.
    Huang, Xiaojing
    Krupin, Oleg
    Seu, Keoki A.
    Parks, Daniel
    Kevan, Stephen
    Lima, Enju
    Kisslinger, Kim
    McNulty, Ian
    Gambino, Richard
    Mangin, Stephane
    Roy, Sujoy
    Fischer, Peter
    PHYSICAL REVIEW LETTERS, 2011, 107 (03)
  • [9] Magnetic imaging with soft X-ray microscopy
    Fischer, P
    Denbeaux, G
    Eimüller, T
    Goll, D
    Schütz, G
    IEEE TRANSACTIONS ON MAGNETICS, 2002, 38 (05) : 2427 - 2431
  • [10] Magnetic soft X-ray transmission microscopy
    Fischer, P
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 2003, 7 (02): : 173 - 179