P-type 6H-SiC films in the creation of triode structures for low ionization radiation

被引:0
作者
Ivanov, AM
Strokan, NB
Davydov, DV
Savkina, NS
Strelchuk, AM
Lebedev, AA
Yakimova, R
机构
[1] AF Ioffe Phys Tech Inst, RU-194021 St Petersburg, Russia
[2] Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden
来源
SILICON CARBIDE AND RELATED MATERIALS - 2002 | 2002年 / 433-4卷
关键词
low ionization radiation; photocurrent; signal amplification; silicon carbide; sublimation epitaxy; triode structures; X-ray;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The signal value of the transistor-like detector on applied voltage was investigated. It was measure induced-current recording from fluxes of X-ray and optical quanta. A superlinear rise in the resulting signal was observed with increasing voltage. The signal was amplified by a factor of several tens with respect to the value chosen for normalization. A description in terms of the phototriode model gives acceptable values for the main parameters: base width, diffusion length of electrons, and space charge region of the collector. It is important that SiC films with the thickness d similar to 10 mum can be used to detect penetrating radiation, for example, X-ray. The effective thickness of the films exceeds d by the signal amplification factor (and proves to be in range of hundred mum).
引用
收藏
页码:969 / 972
页数:4
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