A simple NFC parameters measurement method based on ISO/IEC 14443 standard

被引：0

作者：

Chen, I-Fong ^{[1
]}

Peng, Chia-Mei ^{[2
]}

Yan, Zhi-Da ^{[3
]}

机构：

[1] Jinwen Univ Sci & Technol, Dept Comp & Commun, New Taipei, Taiwan

[2] Feng Chia Univ, Dept Commun Engn, Taichung, Taiwan

[3] Natl Taiwan Univ, Grad Inst Commun Engn, Taipei, Taiwan

来源：

2019 IEEE INTERNATIONAL CONFERENCE ON RFID TECHNOLOGY AND APPLICATIONS (IEEE RFID-TA 2019) | 2019年

关键词：

D O I：

10.1109/rfid-ta.2019.8892221

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A simple NFC (near field communication) parameters measurement method based on ISO/IEC 14443 standard was presented in this article. The measurement procedure of three test items, namely off-keying duration time evaluation, H-field strength measurement and NFC system performance evaluation were illustrated. By using the realtime spectrum and oscilloscope, the calculation with all conversion and correction factors is derived. Experimental results are shown to verify the validity of theoretical work.

引用

页数：4