共 50 条
- [1] The investigation of porous silicon by the methods of X-ray diffractometry Izvestiya Vysshikh Uchebnykh Zavedenii, Tsvetnaya Metallurgiya, (05): : 70 - 78
- [2] X-ray diffractometry investigation of the hexagonal phase of GaP Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, 2001, (06): : 12 - 16
- [3] X-RAY DIFFERENTIAL DIFFRACTOMETRY APPLIED TO GAN GROWN ON SIC COMPOUND SEMICONDUCTORS 1994, 1995, (141): : 431 - 436
- [4] Estimation of elastic constants for some metals on the X-ray diffractometry data METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2006, 28 (04): : 433 - 439
- [5] QUANTITATIVE X-RAY DIFFRACTOMETRY APPLIED TO NATIONAL PORTLAND-CEMENT REVISTA PORTUGESA DE QUIMICA, 1971, 13 (03): : 168 - &
- [6] X-RAY INVESTIGATION ON FATIGUE OF METALS INTERNATIONAL JOURNAL OF FRACTURE MECHANICS, 1966, 2 (01): : 383 - 383
- [8] X-ray diffraction and X-ray reflectivity applied to investigation of thin films ADVANCES IN SOLID STATE PHYSICS 41, 2001, 41 : 275 - 286
- [10] X-ray diffractometry with a microfocus source ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C171 - C171