Shaping tight-focusing patterns of linearly polarized beams through elliptic apertures

被引：5

作者：

Ando, Taro ^{[1
]}

Ohtake, Yoshiyuki ^{[1
]}

Inoue, Takashi ^{[1
]}

Itoh, Haruyasu ^{[1
]}

Matsumoto, Naoya ^{[1
]}

Fukuchi, Norihiro ^{[1
]}

机构：

[1] Hamamatsu Photon KK, Cent Res Lab, Hamakita Ku, Shizuoka 4348601, Japan

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 02期

关键词：

D O I：

10.1063/1.2834899

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We propose elliptic deformation of apertures for shaping focusing patterns of tightly focused linearly polarized beams. Numerical integration of the vectorial Rayleigh-Sommerfeld diffraction formula predicts the formation of symmetric focusing patterns by shrinking the aperture shape in the direction perpendicular to the polarization of the beams. The elliptic deformation is also applied to a focused linearly polarized beam through an annular aperture to demonstrate the formation of smaller symmetric focal spot than that through a simple oval aperture.

引用

页数：3

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