An on-chip self-repair calculation and fusing methodology

被引：10

作者：

Anand, D ^{[1
]}

Cowan, B ^{[1
]}

Farnsworth, O ^{[1
]}

Jakobsen, P ^{[1
]}

Oakland, S ^{[1
]}

Ouellette, MR ^{[1
]}

Wheater, DL ^{[1
]}

机构：

[1] IBM Microelect, Essex Jct, VT 05452 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2003年 / 20卷 / 05期

关键词：

D O I：

10.1109/MDT.2003.1232258

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Laser fusing is a standard technique for improving yield with memory reconfiguration and repair, but implementing fusing in production can be challenging and costly. This article introduces an electrically programmable polysilicon fuse and shows how it can reduce fuse area and programming complexity.

引用

页码：67 / 75

页数：9

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