In-situ NH3 monitoring by TDL for SCR/SNCR NOx reduction systems

被引:0
作者
Cowie, A [1 ]
机构
[1] Analyt Specialties, Houston, TX 77058 USA
来源
PROCEEDINGS OF THE 46TH ANNUAL ISA ANALYSIS DIVISION SYMPOSIUM, VOL 34 | 2001年 / 410卷
关键词
tunable diode laser; TDL; NOx reduction; ammonia slip; NH3; slip; selective catalytic reduction; SCR; selective non-catalytic reduction; SNCR; in-situ; cross stack; outlet duct;
D O I
暂无
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
This article discusses the fact that lower NOx emission limits are creating demand for Selective Catalytic Reduction (SCR) and Selective Non Catalytic Reduction (SNCR) systems. These systems utilize ammonia injection for reaction with the source NOx and catalytic bed thereby significantly reducing the NOx emissions. However, until recently there has been no accurate or reliable on-line analytical method for monitoring the un-reacted NH3 (known as 'Ammonia Slip'). This paper discusses the technical merits of measuring the ammonia slip directly in the outlet duct of an SCR/SNCR with a Tunable Diode Laser (TDL) analyzer. Significant benefits exist with an in-situ TDL, especially the elimination of the traditionally problematic extractive sample conditioning systems.
引用
收藏
页码:195 / 202
页数:8
相关论文
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*CEMS, 1993, 15 CEMS USEPA
[2]  
*SCR, 1997, EC6323 SCR
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SHIOMOTO G, UPDATE EPRI CONTINUO