A pseudo-single-crystalline germanium film for flexible electronics

被引:46
作者
Higashi, H. [1 ]
Kasahara, K. [2 ]
Kudo, K. [3 ]
Okamoto, H. [3 ]
Moto, K. [3 ]
Park, J. -H. [2 ]
Yamada, S. [1 ]
Kanashima, T. [1 ]
Miyao, M. [2 ]
Tsunoda, I. [3 ]
Hamaya, K. [1 ]
机构
[1] Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan
[2] Kyushu Univ, Dept Elect, Fukuoka 8190395, Japan
[3] Kumamoto Natl Coll Technol, Kumamoto 8611102, Japan
基金
日本学术振兴会;
关键词
EPITAXIAL-GROWTH; GE FILMS; LAYER; TRANSISTORS; SUBSTRATE; SEMICONDUCTORS; TEMPERATURE; INSULATORS; AL2O3;
D O I
10.1063/1.4906612
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate large-area (similar to 600 mu m), (111)-oriented, and high-crystallinity, i.e., pseudo-single-crystalline, germanium (Ge) films at 275 degrees C, where the temperature is lower than the softening temperature of a flexible substrate. A modulated gold-induced layer exchange crystallization method with an atomic-layer deposited Al2O3 barrier and amorphous-Ge/Au multilayers is established. From the Raman measurements, we can judge that the crystallinity of the obtained Ge films is higher than those grown by aluminum-induced-crystallization methods. Even on a flexible substrate, the pseudo-single-crystalline Ge films for the circuit with thin-film transistor arrays can be achieved, leading to high-performance flexible electronics based on an inorganic-semiconductor channel. (C) 2015 AIP Publishing LLC.
引用
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页数:5
相关论文
共 37 条
[1]   Direct in situ transmission electron microscopy observation of Al push up during early stages of the Al-induced layer exchange [J].
Birajdar, B. I. ;
Antesberger, T. ;
Butz, B. ;
Stutzmann, M. ;
Spiecker, E. .
SCRIPTA MATERIALIA, 2012, 66 (08) :550-553
[2]   Epitaxial lift-off process for gallium arsenide substrate reuse and flexible electronics [J].
Cheng, Cheng-Wei ;
Shiu, Kuen-Ting ;
Li, Ning ;
Han, Shu-Jen ;
Shi, Leathen ;
Sadana, Devendra K. .
NATURE COMMUNICATIONS, 2013, 4
[3]  
Crawford GP, 2005, WILEY-SID SER DISPL, P1, DOI 10.1002/0470870508
[4]   Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances [J].
Fortunato, E. ;
Barquinha, P. ;
Martins, R. .
ADVANCED MATERIALS, 2012, 24 (22) :2945-2986
[5]   Doping and Raman Characterization of Boron and Phosphorus Atoms in Germanium Nanowires [J].
Fukata, Naoki ;
Sato, Keisuke ;
Mitome, Masanori ;
Bando, Yoshio ;
Sekiguchi, Takashi ;
Kirkham, Melanie ;
Hong, Jung-il ;
Wang, Zhong Lin ;
Snyder, Robert L. .
ACS NANO, 2010, 4 (07) :3807-3816
[6]   Low-temperature Al2O3 atomic layer deposition [J].
Groner, MD ;
Fabreguette, FH ;
Elam, JW ;
George, SM .
CHEMISTRY OF MATERIALS, 2004, 16 (04) :639-645
[7]   Ferromagnetism and Electronic Structures of Nonstoichiometric Heusler-Alloy Fe3-xMnxSi Epilayers Grown on Ge(111) [J].
Hamaya, K. ;
Itoh, H. ;
Nakatsuka, O. ;
Ueda, K. ;
Yamamoto, K. ;
Itakura, M. ;
Taniyama, T. ;
Ono, T. ;
Miyao, M. .
PHYSICAL REVIEW LETTERS, 2009, 102 (13)
[8]   LOW TEMPERATURE REACTIONS AT SI/METAL INTERFACES; WHAT IS GOING ON AT THE INTERFACES? [J].
Hiraki, Akio .
SURFACE SCIENCE REPORTS, 1983, 3 (07) :357-412
[9]   Flexible Ge-on-polyimide detectors [J].
Ho, W. S. ;
Dai, Y. -H. ;
Deng, Y. ;
Lin, C. -H. ;
Chen, Y. -Y. ;
Lee, C. -H. ;
Liu, C. W. .
APPLIED PHYSICS LETTERS, 2009, 94 (26)
[10]  
Horowitz G, 1998, ADV MATER, V10, P365, DOI 10.1002/(SICI)1521-4095(199803)10:5<365::AID-ADMA365>3.0.CO