Identification and magneto-optical properties of the NV center in 4H-SiC

被引:80
作者
von Bardeleben, H. J. [1 ]
Cantin, J. L. [1 ]
Rauls, E. [2 ]
Gerstmann, U. [2 ]
机构
[1] Univ Paris 06, INSP, CNRS, UMR 7588, F-75005 Paris, France
[2] Univ Paderborn, Lehrstuhl Theoret Phys, D-33098 Paderborn, Germany
关键词
SPIN QUBITS; DEFECT; DIVACANCY; DIAMOND;
D O I
10.1103/PhysRevB.92.064104
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single spin carrying defects are key elements in quantum information and nanosensing technology with the nitrogen-vacancy (NV) center in diamond being the outstanding example. In a combined electron paramagnetic resonance and first-principles modeling study we verify the existence of such NV centers in 4H-SiC in the form of silicon vacancy-nitrogen pairs (VSiNC) and explore their basic magneto-optical properties. Similar to the NV center in diamond, the (3)A(2) triplet ground state (with a zero-field splitting of D = 429 x 10(-4) cm(-1)) of the singly negative charge state in axial coordination can be optically spin polarized at room temperature. Given the mature technology of 4H-SiC the NV center in this material is expected to play an important role in future spintronics applications.
引用
收藏
页数:6
相关论文
共 50 条
[41]   Effect of growth condition on micropipe filling of 4H-SiC epitaxial layer [J].
Kojima, K. ;
Nishizawa, S. ;
Kuroda, S. ;
Okumura, H. ;
Arai, K. .
JOURNAL OF CRYSTAL GROWTH, 2005, 275 (1-2) :E549-E554
[42]   Detection of minority carrier traps in p-type 4H-SiC [J].
Alfieri, G. ;
Kimoto, T. .
APPLIED PHYSICS LETTERS, 2014, 104 (09)
[43]   Diagnostic of Fusion Neutrons on EAST Tokamak Using 4H-SiC Detector [J].
Hong, B. ;
Zhong, G. Q. ;
Hu, L. Q. ;
Zhang, R. X. ;
Zhou, R. J. ;
Li, K. ;
Huang, L. S. ;
Chen, W. K. .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2022, 69 (03) :639-644
[44]   Low-pressure fast growth and characterization of 4H-SiC epilayers [J].
Tsuchida, H. ;
Ito, M. ;
Kamata, I. ;
Nagano, M. ;
Miyazawa, T. ;
Hoshino, N. .
SILICON CARBIDE AND RELATED MATERIALS 2009, PTS 1 AND 2, 2010, 645-648 :77-82
[45]   Study on 4H-SiC Trench Schottky-Type Neutron Detector [J].
Jiang, Wan-Chen ;
Wang, Ying ;
Hong, Bing ;
Liu, Yun-Tao ;
Zhang, Rui .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 73
[46]   Delineation of Defects Reducing Schottky Barrier Heights on 4H-SiC by the Electrochemical Deposition [J].
Kato, Masashi ;
Ogawa, Kazuya ;
Ichimura, Masaya .
SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 :373-376
[47]   Electron spin coherence of silicon vacancies in proton- irradiated 4H-SiC [J].
Embley, J. S. ;
Colton, J. S. ;
Miller, K. G. ;
Morris, M. A. ;
Meehan, M. ;
Crossen, S. L. ;
Weaver, B. D. ;
Glaser, E. R. ;
Carter, S. G. .
PHYSICAL REVIEW B, 2017, 95 (04)
[48]   Luminescence from color centres induced by oxidation and ion irradiation in 4H-SiC [J].
Chakravorty, Anusmita ;
Kabiraj, D. .
JOURNAL OF LUMINESCENCE, 2022, 244
[49]   Spin coherence and echo modulation of the silicon vacancy in 4H-SiC at room temperature [J].
Carter, S. G. ;
Soykal, Oe. O. ;
Dev, Pratibha ;
Economou, Sophia E. ;
Glaser, E. R. .
PHYSICAL REVIEW B, 2015, 92 (16)
[50]   Determination of stress components in 4H-SiC power devices via Raman spectroscopy [J].
Sugie, Ryuichi ;
Uchida, Tomoyuki .
JOURNAL OF APPLIED PHYSICS, 2017, 122 (19)