Predictive Formulas to Improve Transformer Protection During Inrush Current Using the Proposed DC Equivalent Circuit

被引:14
作者
Moradi, Arash [1 ]
Madani, Seyed M. [1 ]
机构
[1] Univ Isfahan, Fac Engn, Dept Elect Engn, Esfahan 8174673441, Iran
关键词
Surges; Circuit faults; Surge protection; Equivalent circuits; Silicon carbide; Transformer cores; Mathematical model; Transformer protection; inrush current; sympathetic inrush current; power system transient; dc model; POWER TRANSFORMERS; LOW-FREQUENCY; DIFFERENTIAL PROTECTION; SYMPATHETIC INRUSH; INTERNAL FAULTS; MODEL; CLASSIFICATION; TRANSIENTS; RELAY;
D O I
10.1109/TPWRD.2019.2930758
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Switching-on a power transformer creates energizing inrush current (EIC) which in turn leads to sympathetic inrush current (SIC) in adjacent in-service transformers (ITs). Sympathetic inrush current changes the waveform and prolongs the duration of its origin EIC. This makes the analysis and estimation of EIC complicated. Occasionally, the stress of EIC can cause internal short circuit in energizing transformer. Detecting short-circuit fault current during EIC is a challenge for transformer differential protection. On the other hand, SIC may mislead the earth-fault protection of in-service-transformer. This paper, first, proposes a new dc equivalent-circuit based on the dc-component of inrush current, which is efficient in analyzing concurrent EIC and SIC. Next, based on this equivalent circuit, new predictive formulas for EIC and SIC are derived. By employing these formulas, the transformer internal fault during inrush current can be detected based on the comparison between the predicted and measured waveforms, which prevents differential protection from fail-to-trip. Also, the predicted SIC waveform can be compared with the measured waveform to prevent IT earth-fault protection from mal-trip, during inrush current. Finally, the proposed equivalent circuit and formulas are verified using the EMTP simulation results of a real grid, under different system conditions.
引用
收藏
页码:919 / 928
页数:10
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