Direct extraction of SPICE Gummel-Poon parameters for high frequency modeling

被引：1

作者：

Breti, JW ^{[1
]}

Kendall, JD ^{[1
]}

Nathawad, L ^{[1
]}

机构：

[1] Gennum Corp, Burlington, ON L7R 3Y3, Canada

来源：

ICMTS 1998: PROCEEDINGS OF THE 1998 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES | 1998年

关键词：

D O I：

10.1109/ICMTS.1998.688047

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method to directly extract the DC and AC SPICE Gummel-Poon parameters without optimization is presented. The DC extraction uses linear or explicit extraction equations. The AC extraction involves obtaining the SPICE AC equivalent circuit from measured S-parameter data, and then extracting the SPICE parameters from the bias dependence or me AC equivalent circuit elements. By comparing measured and simulated S-parameters it is verified that the resulting parameter set provides accurate modeling across frequency and bias, making accurate circuit simulation and statistical studies possible.

引用

页码：83 / 88

页数：6