Tracks induced in CaF2 by MeV cluster irradiation

被引：51
|
作者：
Jensen, J [1 ]
Dunlop, A
Della-Negra, S
机构：
[1] Ecole Polytech, Solides Irradies Lab, CEA, F-91128 Palaiseau, France
[2] Inst Phys Nucl, CNRS, IN2P3, F-91406 Orsay, France
[3] Odense Univ, Inst Fys, DK-5230 Odense, Denmark
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1998年 / 141卷 / 1-4期
关键词：
MeV cluster irradiation; electronic energy deposition; latent tracks; transmission electron microscopy; inclusions; fluorite (CaF2);
D O I：
10.1016/S0168-583X(98)00171-2
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Samples of fluorite (CaF2) crystals were irradiated at 300 K with cluster ions of a few tens MeV at normal incidence. After irradiation the samples were observed in a transmission electron microscope. The cluster ions create intermittent tracks which are stable under the electron beam. The tracks consist of aligned faceted anion voids, which can also be viewed as calcium inclusions. Furthermore, surface contrasts associated to sputtering are sometimes observed at the track entrance and exit. (C) 1998 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码：753 / 762
页数：10
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