Optical properties of thin epitaxial Ba0.8Sr0.2TiO3 films

被引：5

作者：

Shirokov, V. B. ^{[1
,2
]}

Golovko, Yu. I. ^{[1
]}

Mukhortov, V. M. ^{[1
]}

机构：

[1] Russian Acad Sci, So Sci Ctr, Rostov Na Donu 344006, Russia

[2] So Fed Univ, Rostov Na Donu 344090, Russia

来源：

TECHNICAL PHYSICS | 2012年 / 57卷 / 07期

关键词：

REFRACTIVE-INDEX; CONSTANTS; MICROSTRUCTURE; THICKNESS;

D O I：

10.1134/S1063784212070195

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The properties of nanodimensional (Ba-0.8, Sr-0.2)TiO3 films on single-crystal magnesia substrates are studied. The films are applied by rf sputtering and grow in the layer-by-layer mode. The lattice parameters are measured by the X-ray diffraction method. The transmission of the films with different thicknesses is studied in the wavelength range 190-1100 nm. When analyzing experimental optical parameters, additional relaxation parameters depicting a final lifetime of the oscillator are used to characterize the refractive index and absorption factor in the dispersion relation. Such an approach allows a more accurate approximation of experimental data.

引用

页码：975 / 980

页数：6

共 21 条

[11]

MUKHORTOV VM, 2007, NANOTEKHNIKA, V3, P59

[12] Calculation of thin-film optical constants by transmittance-spectra fitting [J].

Nenkov, M ;

Pencheva, T .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1998, 15 (07) :1852-1857

[13] High nonlinearity of Ba0.6Sr0.4TiO3 films heteroepitaxially grown on MgO substrates [J].

Park, BH ;

Gim, Y ;

Fan, Y ;

Jia, QX ;

Lu, P .

APPLIED PHYSICS LETTERS, 2000, 77 (16) :2587-2589

[14] Ferroelectric and optical properties of Ba0.8Sr0.2TiO3 thin film [J].

Pontes, FM ;

Leite, ER ;

Pontes, DSL ;

Longo, E ;

Santos, EMS ;

Mergulhao, S ;

Pizani, PS ;

Lanciotti, F ;

Boschi, TM ;

Varela, JA .

JOURNAL OF APPLIED PHYSICS, 2002, 91 (09) :5972-5978

[15]

Stenzel O., 2005, The physics of thin film optical spectra

[16] DETERMINATION OF THE THICKNESS AND OPTICAL-CONSTANTS OF AMORPHOUS-SILICON [J].

SWANEPOEL, R .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (12) :1214-1222

[17] Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants [J].

Synowicki, RA .

THIN SOLID FILMS, 1998, 313 :394-397

[18] Optical and electro-optic anisotropy of epitaxial Ba0.7Sr0.3TiO3 thin films [J].

Wang, D. Y. ;

Li, S. ;

Chan, H. L. W. ;

Choy, C. L. .

APPLIED PHYSICS LETTERS, 2010, 96 (06)

[19] BEHAVIOR OF ELECTRONIC DIELECTRIC CONSTANT IN COVALENT AND IONIC MATERIALS [J].

WEMPLE, SH ;

DIDOMENI.M .

PHYSICAL REVIEW B, 1971, 3 (04) :1338-&

[20] Ferroelectric epitaxial thin films for integrated optics [J].

Wessels, Bruce W. .

ANNUAL REVIEW OF MATERIALS RESEARCH, 2007, 37 :659-679

← 1 2 3 →