Optical properties of thin epitaxial Ba0.8Sr0.2TiO3 films

被引：5
作者：
Shirokov, V. B. [1 ,2 ]
Golovko, Yu. I. [1 ]
Mukhortov, V. M. [1 ]
机构：
[1] Russian Acad Sci, So Sci Ctr, Rostov Na Donu 344006, Russia
[2] So Fed Univ, Rostov Na Donu 344090, Russia
来源：
TECHNICAL PHYSICS | 2012年 / 57卷 / 07期
关键词：
REFRACTIVE-INDEX; CONSTANTS; MICROSTRUCTURE; THICKNESS;
D O I：
10.1134/S1063784212070195
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The properties of nanodimensional (Ba-0.8, Sr-0.2)TiO3 films on single-crystal magnesia substrates are studied. The films are applied by rf sputtering and grow in the layer-by-layer mode. The lattice parameters are measured by the X-ray diffraction method. The transmission of the films with different thicknesses is studied in the wavelength range 190-1100 nm. When analyzing experimental optical parameters, additional relaxation parameters depicting a final lifetime of the oscillator are used to characterize the refractive index and absorption factor in the dispersion relation. Such an approach allows a more accurate approximation of experimental data.
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收藏
页码：975 / 980
页数：6
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