Effect of carrier gases on the entrainment defects within AZ91 alloy castings

被引:10
作者
Li, Tian [1 ,2 ]
Davies, J. M. T. [1 ]
Zhu, Xiangzhen [3 ]
机构
[1] Univ Birmingham, Birmingham B15 2TT, W Midlands, England
[2] Grainger & Worrall Ltd, Bridgnorth WV15 5HP, England
[3] Brunel Univ London, Brunel Ctr Adv Solidificat Technol, Kingston Ln, Uxbridge UB8 3PH, Middx, England
基金
英国工程与自然科学研究理事会;
关键词
Magnesium alloy; Casting; Oxide film; Bifilm; Entrainment defect; Reproducibility; OXIDE-FILM DEFECTS; MAGNESIUM ALLOY; MOLTEN MAGNESIUM; MECHANICAL-PROPERTIES; WEIBULL MODULUS; BEHAVIOR; SF6; MICROSTRUCTURE; PROTECTION; OXIDATION;
D O I
10.1016/j.jma.2021.07.005
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
An entrainment defect (also known as a double oxide film defect or bifilm) acts a void containing an entrapped gas when submerged into a light-alloy melt, thus reducing the quality and reproducibility of the final castings. Previous publications, carried out with Al-alloy castings, reported that this trapped gas could be subsequently consumed by the reaction with the surrounding melt, thus reducing the void volume and negative effect of entrainment defects. Compared with Al-alloys, the entrapped gas within Mg-alloy might be more efficiently consumed due to the relatively high reactivity of magnesium. However, research into the entrainment defects within Mg alloys has been significantly limited. In the present work, AZ91 alloy castings were produced under different carrier gas atmospheres (i.e., SF6/CO2, SF6 /air). The evolution processes of the entrainment defects contained in AZ91 alloy were suggested according to the microstructure inspections and thermodynamic calculations. The defects formed in the different atmospheres have a similar sandwich-like structure, but their oxide films contained different combinations of compounds. The use of carrier gases, which were associated with different entrained-gas consumption rates, affected the reproducibility of AZ91 castings. (c) 2021 Chongqing University. Publishing services provided by Elsevier B.V. on behalf of KeAi Communications Co. Ltd. This is an open access article under the CC BY-NC-ND license ( http://creativecommons.org/licenses/by-nc-nd/4.0/ ) Peer review under responsibility of Chongqing University
引用
收藏
页码:129 / 145
页数:17
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