Gate voltage pattern analyze for short-circuit protection in IGBT inverters

被引：22

作者：

Lee, Jun-Bae ^{[1
]}

Hyun, Dong-Seok ^{[1
]}

机构：

[1] Hanyang Univ, Dept Elect Engn, Seoul 133791, South Korea

来源：

2007 IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-6 | 2007年

关键词：

D O I：

10.1109/PESC.2007.4342295

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

For the motor drive applications, short circuit protection is necessary to guarantee safety of all motor drive systems. This paper presents a new scheme for short circuit protection of IGBT by the gate voltage pattern analyzer (GVPA), which operates under the fault conditions such as hard switching fault (HSF) and fault under load (FUL). It has some functions such as short circuit detection through pattern recognition of IGBT gate voltage, gate voltage clamping for the reduction of short circuit current and soft off for the reduction of surge voltage. Moreover, it can be used to be integrated as one gate drive integrated circuit (IC) or high volatge integrated circuit (HVIC) because GVPA supplements logic and low voltage components. This paper provides simulated and actual experimental result of a new scheme under fault conditions.

引用

页码：1913 / 1917

页数：5