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Improvement of the magnetic characteristics of multilayered Ni-Fe thin films by applying external in-plane field during sputtering
被引:3
作者:
Ichihara, T
Nakagawa, S
Naoe, M
机构:
[1] Dept. of Physical Electronics, Tokyo Institute of Technology, Meguro, Tokyo 152
关键词:
D O I:
10.1109/20.539086
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Ni79Fe21 single layers and multilayers composed of Ni79Fe21 layers and paramagnetic Al interlayers were deposited using the facing targets sputtering (FTS) apparatus. During layer deposition, the external field H-ex of 200 Oe along the film plane was applied parallel or transverse to the direction of the plasma confining field H-p of about 30 Oe in the FTS apparatus. The application of H-ex parallel to the H-p direction was not significantly effective for improving soft magnetic characteristics of the films. When H-ex was applied transverse to the H-p direction, the relative permeability mu(r) of the Ni-Fe single layers 100 nm thick was increased, while the coercivity H-c and the squareness ratio M(r)/M(s) of them were not varied. On the other hand, mu(r) of the [Ni-Fe/Al](5) multilayers was extremely and isotropically increased while M(r)/M(s) for the multilayers was decreased down to a half value.
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页码:4582 / 4584
页数:3
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