Cyclic voltammetric studies of the effects of time and temperature on the capacitance of electrochemically deposited nickel hydroxide

被引:151
作者
Kalu, EE [1 ]
Nwoga, TT
Srinivasan, V
Weidner, JW
机构
[1] FAMU, FSU, Coll Engn, Dept Chem Engn, Tallahassee, FL 32310 USA
[2] Univ S Carolina, Dept Chem Engn, Columbia, SC 29208 USA
关键词
pseudocapacitance; capacitor; thermal annealing; cyclic voltammetry; electroprecipitated; nickel oxide;
D O I
10.1016/S0378-7753(00)00520-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A cyclic voltammetric (CV) technique was used to study the combined effects of annealing temperature and time on the pseudocapacitance of thermally treated electroprecipitated nickel hydroxide thin films. Through the analysis of the areas of the CVs cycled between 0 and 0.35 V (versus Ag/AgCl) it is shown that the optimal treatment condition for maximum film capacitance occurs at 300 degreesC for 3 h. On the other hand, using the anodic and cathodic peak currents of the CVs cycled between 0 and 0.5 V (versus Ag/AgCl), the maximum film capacitance is also shown to occur at a thermal treatment condition of 300 degreesC and 3.5 h (or 320 degreesC and 3.2 h for Linear approximations). The two methods demonstrate simple ways of extracting useful information on the electrochemical performance properties of thin films. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:163 / 167
页数:5
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