Note: Curve fit models for atomic force microscopy cantilever calibration in water

被引：2

作者：

Kennedy, Scott J. ^{[1
]}

Cole, Daniel G. ^{[2
]}

Clark, Robert L. ^{[3
]}

机构：

[1] Duke Univ, Dept Mech Engn & Mat Sci, Ctr Biol Inspired Mat & Mat Syst, Durham, NC 27708 USA

[2] Univ Pittsburgh, Dept Mech Engn & Mat Sci, Swanson Sch Engn, Pittsburgh, PA 15260 USA

[3] Univ Rochester, Hajim Sch Engn & Appl Sci, Rochester, NY 14627 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2011年 / 82卷 / 11期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.3661130

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Atomic force microscopy stiffness calibrations performed on commercial instruments using the thermal noise method on the same cantilever in both air and water can vary by as much as 20% when a simple harmonic oscillator model and white noise are used in curve fitting. In this note, several fitting strategies are described that reduce this difference to about 11%. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3661130]

引用

页数：3

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