Note: Curve fit models for atomic force microscopy cantilever calibration in water

被引：2
|
作者：
Kennedy, Scott J. [1 ]
Cole, Daniel G. [2 ]
Clark, Robert L. [3 ]
机构：
[1] Duke Univ, Dept Mech Engn & Mat Sci, Ctr Biol Inspired Mat & Mat Syst, Durham, NC 27708 USA
[2] Univ Pittsburgh, Dept Mech Engn & Mat Sci, Swanson Sch Engn, Pittsburgh, PA 15260 USA
[3] Univ Rochester, Hajim Sch Engn & Appl Sci, Rochester, NY 14627 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2011年 / 82卷 / 11期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.3661130
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Atomic force microscopy stiffness calibrations performed on commercial instruments using the thermal noise method on the same cantilever in both air and water can vary by as much as 20% when a simple harmonic oscillator model and white noise are used in curve fitting. In this note, several fitting strategies are described that reduce this difference to about 11%. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3661130]
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页数：3
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