Shape transition of InAs quantum dots by growth at high temperature

被引:153
作者
Saito, H [1 ]
Nishi, K [1 ]
Sugou, S [1 ]
机构
[1] NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Ibaraki, Osaka 3058501, Japan
关键词
D O I
10.1063/1.123506
中图分类号
O59 [应用物理学];
学科分类号
摘要
The shape of InAs quantum dots grown on GaAs substrates by molecular beam epitaxy is investigated at various growth temperatures. A dot with a new shape surrounded by {110} facets and having a high aspect ratio appears at temperatures over 510 degrees C. This dot is transformed from a pyramid shape (low aspect ratio) when its volume exceeds a critical value by raising the growth temperature. The shape transition indicates that the high-aspect-ratio dot is energetically favorable at a large volume. A narrow energy width of photoluminescence, 35 meV at room temperature, is obtained by the growth of the high-aspect-ratio dots, which have a fairly good size uniformity of less than 4% deviation. (C) 1999 American Institute of Physics. [S0003-6951(99)02209-3].
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页码:1224 / 1226
页数:3
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