Face image reconstructions by using machine learning system

被引：1
|
作者：
Citko, Wieslaw [1 ]
Trzebiatowski, Adam [2 ]
Sienko, Wieslaw [1 ]
机构：
[1] Uniwersytet Morski Gdynia, Wydzial Elekt, Ul Morska 81-87, PL-81225 Gdynia, Poland
[2] Gdansk Tech Univ, Wydzial Elekt Telekomunikacji & Informatyki, Ul G Narutowicza 11-12, PL-80233 Gdansk, Poland
来源：
PRZEGLAD ELEKTROTECHNICZNY | 2021年 / 97卷 / 12期
关键词：
artificial intelligence; machine learning; image reconstruction and recognition;
D O I：
10.15199/48.2021.12.40
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper presents the possibilities for using a proprietary model of a machine learning system for the reconstruction and recognition of distorted or damaged patterns, in particular the images of faces partially covered with masks. The presented considerations do not constitute final solutions at the application level for an image processing system. Rather, they should be treated as a proof-of-concept and a justification for developing solutions using systems based on pattern superposition.
引用
收藏
页码：191 / 194
页数：4
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