Challenges in embedded memory design and test

被引：39

作者：

Marinissen, EJ ^{[1
]}

Prince, B ^{[1
]}

Keitel-Schulz, D ^{[1
]}

Zorian, Y ^{[1
]}

机构：

[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands

来源：

DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS | 2005年

关键词：

D O I：

10.1109/DATE.2005.92

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Both the number of embedded memories, as well as the total embedded memory content in our chips is g-rowing steadily. Time for chip designers, EDA makers, and test engineers to update their knowledge on memories. This Hot Topic paper provides an embedded tutorial on embedded memories, in terms of what is new and coming versus what is old and vanishing, and what are the associated design, test, and repair challenges related to using embedded memories.

引用

页码：722 / 727

页数：6

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