Chemically Deposited CdS Buffer/Kesterite Cu2ZnSnS4 Solar Cells: Relationship between CdS Thickness and Device Performance

被引:30
|
作者
Hong, Chang Woo [1 ,2 ]
Shin, Seung Wook [3 ,4 ]
Suryawanshi, Mahesh P. [1 ,2 ]
Gang, Myeng Gil [1 ,2 ]
Heo, Jaeyeong [1 ,2 ]
Kim, Jin Hyeok [1 ,2 ]
机构
[1] Chonnam Natl Univ, Dept Mat Sci & Engn, Gwangju 61186, South Korea
[2] Chonnam Natl Univ, Optoelect Convergence Res Ctr, Gwangju 61186, South Korea
[3] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA
[4] Univ Toledo, Wright Ctr Photovolta Innovat & Commercializat, Toledo, OH 43606 USA
基金
新加坡国家研究基金会;
关键词
earth-abundant elements; copper zinc tin sulfide (CZTS); thin-film solar cells; CdS buffer; device performance;
D O I
10.1021/acsami.7b09266
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Earth-abundant, copper zinc tin sulfide (CZTS), kesterite, is an attractive absorber material for thin-film solar cells (TFSCs). However, the open-circuit voltage deficit (V-oc-deficit) resulting from a high recombination rate at the buffer/absorber interface is one of the major challenges that must be overcome to improve the performance of kesterite-based TFSCs. In this paper, we demonstrate the relationship between device parameters and performances for chemically deposited CdS buffer/CZTS-based heterojunction TFSCs as a function of buffer layer thickness, which could change the CdS/CZTS interface conditions such as conduction band or valence band offsets, to gain deeper insight and understanding about the V-oc-deficit behavior from a high recombination rate at the CdS buffer/kesterite interface. Experimental results show that device parameters and performances are strongly dependent on the CdS buffer thickness. We postulate two meaningful consequences: (i) Device parameters were improved up to a CdS buffer thickness of 70 nm, whereas they deteriorated at a thicker CdS buffer layer. The V-oc-deficit in the solar cells improved up to a CdS buffer thickness of 92 nm and then deteriorated at a thicker CdS buffer layer. (ii) The minimum values of the device parameters were obtained at 70 nm CdS thickness in the CZTS TFSCs. Finally, the highest conversion efficiency of 8.77% (V-oc: 494 mV, J(sc): 34.54 mA/cm(2), and FF: 51%) is obtained by applying a 70 nm thick CdS buffer to the Cu2ZnSn(S,Se)(4) absorber layer.
引用
收藏
页码:36733 / 36744
页数:12
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