Nanostructured CNx (0<x<0.2) films grown by supersonic cluster beam deposition

被引:17
作者
Bongiorno, G
Blomqvist, M
Piseri, P
Milani, P
Lenardi, C
Ducati, C
Caruso, T
Rudolf, P
Wachtmeister, S
Csillag, S
Coronel, E
机构
[1] Univ Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy
[2] Univ Milan, CIMAINA, I-20133 Milan, Italy
[3] Univ Milan, INFM, Ist Fisiol Gen & Chim Biol, I-20134 Milan, Italy
[4] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
[5] Univ Calabria, INFM, Dipartimento Fis, I-87036 Arcavacata Di Rende, CS, Italy
[6] Univ Groningen, Ctr Mat Sci, NL-9747 AG Groningen, Netherlands
[7] Stockholm Univ, Dept Phys, SCFAB, SE-10691 Stockholm, Sweden
[8] Uppsala Univ, Angstrom Lab, Dept Mat Sci, S-75121 Uppsala, Sweden
关键词
C. electron energy loss spectroscopy; electron microscopy; X-ray photoelectron spectroscopy; D. electronic structure; chemical structure;
D O I
10.1016/j.carbon.2005.01.022
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Nanostructured CNx thin films were prepared by supersonic cluster beam deposition (SCBD) and systematically characterized by transmission electron microscopy (TEM), electron energy-loss spectroscopy (EELS), X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The incorporation of nitrogen in the films (0 < x < 0.2) and the nanostructure were controlled by using different synthesis routes. Films containing bundles of well-ordered graphene multilayers, onions and nanotubes embedded in an amorphous matrix were grown alongside purely amorphous films by changing the deposition parameters. Graphitic nanostructures were synthesized without using metallic catalysts. The structural and electronic properties of the films have been studied by EELS. The role played by N in the carbon natiostructures has been deduced from XPS line-shape analysis. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1460 / 1469
页数:10
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