共 11 条
- [2] FUJITA K, 1995, J SUPERCOMPUT TECHNO, V5, P61
- [3] Stencil reticle development for electron beam projection system [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06): : 2864 - 2867
- [4] Error budget analysis of the SCALPEL(R) mask for sub-0.2 mu m lithography [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06): : 2483 - 2487
- [5] MASK FABRICATION FOR PROJECTION ELECTRON-BEAM LITHOGRAPHY INCORPORATING THE SCALPEL TECHNIQUE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 3000 - 3004
- [7] Electron scattering and transmission through SCALPEL masks [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (06): : 3385 - 3391
- [8] PHEIFFER HC, 1995, JPN J APPL PHYS PT 1, V34, P6658
- [9] Effects of accelerating voltage and pattern size on electron scattering by electron-beam mask [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (06): : 2263 - 2268
- [10] Electron scattering by electron-beam mask with tapered aperture in cell projection lithography [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 3845 - 3849