Hydrogenated amorphous silicon oxide containing a microcrystalline silicon phase and usage as an intermediate reflector in thin-film silicon solar cells

被引:104
作者
Lambertz, A. [1 ]
Grundler, T. [1 ]
Finger, F. [1 ]
机构
[1] Forschungszentrum Julich, Photovolta IEK5, D-52425 Julich, Germany
关键词
LAYERS; SEED;
D O I
10.1063/1.3592208
中图分类号
O59 [应用物理学];
学科分类号
摘要
To further improve the stability of amorphous/microcrystalline silicon (a-Si:H/mu c-Si:H) tandem solar cells, it is important to reduce the thickness of the a-Si: H top cell. This can be achieved by introduction of an intermediate reflector between the a-Si: H top and the mu c-Si: H bottom cell which reflects light back into the a-Si: H cell and thus, increases its photocurrent at possibly reduced thickness. Microcrystalline silicon oxide (mu c-SiOx:H) is used for this purpose and the trade-off between the material's optical, electrical and structural properties is studied in detail. The material is prepared with plasma enhanced chemical vapor deposition from gas mixtures of silane, carbon dioxide and hydrogen. Phosphorus doping is used to make the material highly conductive n-type. Intermediate reflectors with different optical and electrical properties are then built into tandem solar cells as part of the inner n/p-recombination junction. The quantum efficiency and the reflectance of these solar cells are evaluated to find optical gains and losses due to the intermediate reflector. Suitable intermediate reflectors result in a considerable increase in the top cell current density which allows a reduction of the a-Si:H top cell thickness of about 40% for a tandem cell while keeping the current density of the device constant. (C) 2011 American Institute of Physics. [doi:10.1063/1.3592208]
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页数:10
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共 30 条
  • [1] In situ silicon oxide based intermediate reflector for thin-film silicon micromorph solar cells
    Buehlmann, P.
    Bailat, J.
    Domine, D.
    Billet, A.
    Meillaud, F.
    Feltrin, A.
    Ballif, C.
    [J]. APPLIED PHYSICS LETTERS, 2007, 91 (14)
  • [2] PHOTO-LUMINESCENCE IN THE AMORPHOUS SYSTEM SIOX
    CARIUS, R
    FISCHER, R
    HOLZENKAMPFER, E
    STUKE, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (06) : 4241 - 4243
  • [3] CHU WK, 1986, BACKSCATTERING SPECT
  • [4] A constructive combination of antireflection and intermediate-reflector layers for a-Si/μc-Si thin film solar cells
    Das, Chandan
    Lambertz, Andreas
    Huepkes, Juergen
    Reetz, Wilfried
    Finger, Friedhelm
    [J]. APPLIED PHYSICS LETTERS, 2008, 92 (05)
  • [5] Optical management in high-efficiency thin-film silicon micromorph solar cells with a silicon oxide based intermediate reflector
    Domine, Didier
    Buehlmann, Peter
    Bailat, Julien
    Billet, Adrian
    Feltrin, Andrea
    Ballif, Christophe
    [J]. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2008, 2 (04): : 163 - 165
  • [6] FINGER F, 2010, THIN FILM SILICON SO
  • [7] The ''micromorph'' solar cell: Extending a-si:H technology towards thin film crystalline silicon
    Fischer, D
    Dubail, S
    Selvan, JAA
    Vaucher, NP
    Platz, R
    Hof, C
    Kroll, U
    Meier, J
    Torres, P
    Keppner, H
    Wyrsch, N
    Goetz, M
    Shah, A
    Ufert, KD
    [J]. CONFERENCE RECORD OF THE TWENTY FIFTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1996, 1996, : 1053 - 1056
  • [8] Roles of microcrystalline silicon p layer as seed, window, and doping layers for microcrystalline silicon p-i-n solar cells
    Fujibayashi, T
    Kondo, M
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 99 (04)
  • [9] N-type hydrogenated amorphous silicon oxide containing a microcrystalline silicon phase as an intermediate reflector in silicon thin film solar cells
    Grundler, Thomas
    Lambertz, Andreas
    Finger, Friedhelm
    [J]. PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4, 2010, 7 (3-4): : 1085 - 1088
  • [10] New high-precision 5-axes RBS/channeling goniometer for ion beam analysis of 150 mm ⊘ wafers
    Holländer, B
    Heer, H
    Wagener, M
    Halling, H
    Mantl, S
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 : 227 - 230