Using nanoindentation to investigate the temperature cycling of Sn-37Pb solders

被引:3
作者
Wen, Hua-Chiang [1 ]
Chou, Wu-Ching [1 ]
Lin, Po-Chen [2 ]
Jeng, Yeau-Ren [3 ]
Chen, Chien-Chang [4 ]
Chen, Hung-Ming [5 ]
Jiang, Don Son [6 ]
Cheng, Chun-Hu [7 ]
机构
[1] Natl Chiao Tung Univ, Dept Electrophys, Hsinchu 300, Taiwan
[2] Natl Chiao Tung Univ, Dept Mech Engn, Hsinchu 300, Taiwan
[3] Natl Chung Cheng Univ, Dept Mech Engn, Chiayi 621, Taiwan
[4] Natl Chiao Tung Univ, Res Grp Biomed Image Proc, Shing Tung Yau Ctr, Hsinchu 300, Taiwan
[5] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 300, Taiwan
[6] Siliconware Precis Ind Co Ltd, Mat & Design Engn Div, Engn Ctr, Taichung 400, Taiwan
[7] Natl Taiwan Normal Univ, Dept Mechatron Engn, Taipei 106, Taiwan
关键词
Intermetallic compounds; Diffusion; Recrystallization; Electron microscopy; LOW-COST; RECRYSTALLIZATION; JOINTS; MICROSTRUCTURE; ALLOYS; INTERCONNECTIONS; MORPHOLOGY; EVOLUTION; STRESS;
D O I
10.1016/j.microrel.2017.05.004
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using nanoindentation and energy dispersive X-ray spectrometry (EDS), we have conducted an investigation into corner failures to elucidate not only the nanomechanical properties of Sn-37Pb solder balls but also the effects of temperature cycling tests (TCTs). We found that the hardness of Sn-37Pb solder balls was greater in central locations [1.18 +/- 0.05 GPa for room-temperature (RT) sample; 1.3 +/- 0.05 GPa for TCT sample], but had standard values in corner locations (>0.2 +/- 0.02 GPa). The modulus increased after the TCTs. Nevertheless, the mechanical properties were closely related to the average area of the alpha-Pb phase. The average area of the Pb-rich region was more stable after the TCTs than that of the RT sample, due to the enhanced mechanical properties of the Sn-37Pb solder, suggesting good reliability. From an analysis of average areas in the RT sample, it appears that the Pb-rich solid solution that formed led to weak Sn-Pb bonds near the corner locations. Electron back scattered diffraction measurements revealed that grains with grain boundaries formed as a result of accelerated TCT cycling. We conclude that Sn-Pb recrystallization was initiated and propagated after the TCTs, followed by propagation to the interfacial region. (C) 2017 Published by Elsevier Ltd.
引用
收藏
页码:111 / 117
页数:7
相关论文
共 49 条
[21]   Dynamic strength and strain rate sensitivity of 37 wt% pb 63 wt% Sn eutectic solders [J].
Wang, B ;
Zheng, J ;
Shu, D .
ENGINEERING PLASTICITY FROM MACROSCALE TO NANOSCALE PTS 1 AND 2, 2003, 233-2 :181-186
[22]   Microstructure evolution and pull strength in Sn-8Zn-3Bi solder and eutectic Sn-37Pb solder for CSP joints [J].
Kim, KS ;
Back, TS ;
Yang, JM ;
Yu, CH .
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2005, 47 :S459-S463
[23]   Microstructural Evolution and Migration Mechanism Study in a Eutectic Sn-37Pb Lap Joint Under High Current Density [J].
Zhihao Zhang ;
Huijun Cao ;
Haifeng Yang ;
Yong Xiao ;
Mingyu Li ;
Yuxi Yu ;
Shun Yao .
Journal of Electronic Materials, 2017, 46 :5028-5038
[24]   Electromigration behavior of Sn-3.0Ag-0.5Cu/Sn-37Pb hybrid solder joints with various mixed percentages for aerospace electronics [J].
Yin, S. Q. ;
Ren, J. ;
Huang, M. L. .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2024, 35 (12)
[25]   Individual Phase Mechanical Properties at Different Temperatures of Sn-Ag-Cu Lead-Free Solders Incorporating Special Pileup Effects Using Nanoindentation [J].
Sadiq, Muhammad ;
Lecomte, Jean-Sebastien ;
Cherkaoui, Mohammed .
JOURNAL OF ELECTRONIC PACKAGING, 2015, 137 (03)
[26]   A Novel Electronic Packaging Method to Replace High-Temperature Sn-Pb Solders [J].
Yen, Yee-Wen ;
Hsiao, Hsien-Ming ;
Shao, Pei-Sheng ;
Chang, Yen Wei .
JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (10) :3914-3919
[27]   A Novel Electronic Packaging Method to Replace High-Temperature Sn-Pb Solders [J].
Yee-wen Yen ;
Hsien-Ming Hsiao ;
Pei-Sheng Shao ;
Yen Wei Chang .
Journal of Electronic Materials, 2015, 44 :3914-3919
[28]   Effect of Sn orientation on Cu diffusion for Pb-free solders under a temperature gradient [J].
Ouyang, Fan-Yi ;
Hsu, Wei-Neng ;
Yang, Yi-Shan .
2015 International Conference on Electronic Packaging and iMAPS All Asia Conference (ICEP-IAAC), 2015, :486-490
[29]   Dissolution and Interface Reactions between Palladium and Tin(Sn)-Based Solders: Part II. 63Sn-37Pb Alloy [J].
Vianco, Paul T. ;
Rejent, Jerome A. ;
Zender, Gary L. ;
Hlava, Paul F. .
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2010, 41A (12) :3053-3064
[30]   Creep Behavior of Low-temperature Sn-In Solder using Nanoindentation Test [J].
Nitta, Shunya ;
Tatsumi, Hiroaki ;
Nishikawa, Hiroshi .
2024 INTERNATIONAL 3D SYSTEMS INTEGRATION CONFERENCE, 3DIC, 2024,