Effects of on-chip decoupling capacitor on switching noise and radiated emission

被引：1

作者：

Sudo, T ^{[1
]}

Nakano, K ^{[1
]}

Kudo, J ^{[1
]}

Haga, S ^{[1
]}

机构：

[1] Tsukuba Ctr, Assoc Super Adv Elect Technol ASET, Tsukuba, Ibaraki 3050047, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2003年 / 42卷 / 10期

关键词：

simultaneous switching noise; electromagnetic radiation; on-chip decoupling capacitor;

D O I：

10.1143/JJAP.42.6380

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Simultaneous switching noise and electromagnetic radiation in electronic systems are becoming serious problems with the increase in operating speed of digital circuits. Recently, it was recognized that LSI chips are primary sources of electromagnetic radiation. This paper presents experimental results using two types of test chips, one with and one without an on-chip decoupling capacitor. The effects of the on-chip decoupling capacitor on radiated emission and. simultaneous switching noise were characterized by activating I/O circuits or core logic circuits. More than 5 dB of electromagnetic radiation were reduced with the implementation of the on-chip decoupling capacitor for core logic operation.

引用

页码：6380 / 6383

页数：4

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