Preparation of (001)-oriented Pb(Zr,Ti)O3 thin films and their piezoelectric applications

被引:57
作者
Fujii, Eiji [1 ]
Takayama, Ryoichi [1 ]
Nomura, Kouji [1 ]
Murata, Akiko [1 ]
Hirasawa, Taku [1 ]
Tomozawa, Atsushi [1 ]
Fujii, Satoru [1 ]
Kamada, Takeshi [1 ]
Torii, Hideo [1 ]
机构
[1] Matsushita Elect Ind Co Ltd, Adv Devices Dev Ctr, Moriguchi, Osaka 5708501, Japan
关键词
D O I
10.1109/TUFFC.2007.556
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
Preparation of (001)-oriented Pb(Zr,Ti)O-3 (PZT) thin films and their applications to a sensor and actuators were investigated. These thin films, which have a composition close to the morphotropic phase boundary, were epitaxially grown on (100)MgO single-crystal substrates by RIP magnetron sputtering. These (001)-oriented PZT thin films could be obtained on various kinds of substrates, such as glass and Si, by introducing (100)-oriented MgO buffer layers. In addition, the (001)-oriented PZT thin films could be obtained on Si substrates without buffer layers by optimizing the sputtering conditions. All of these thin films showed excellent piezoelectric properties without the need for poling treatment. The PZT thin films on the MgO substrates had a high piezoelectric coefficient, d(31), Of -100 pm/V, and an extremely low relative dielectric constant, E,, of 240. The PZT thin films on Si substrate had a very high d(31) Of -150 PM/V and an epsilon(r) = 700. These PZT thin films were applied to an angular rate sensor with a tuning fork in a car navigation system, to a dual-stage actuator for positioning the magnetic head of a high-density hard disk drive, and to an actuator for an inkjet printer head for industrial on-demand printers.
引用
收藏
页码:2431 / 2438
页数:8
相关论文
共 23 条
[1]   Piezoelectric properties and poling effect of Pb(Zr, Ti)O3 thick films prepared for microactuators by aerosol deposition [J].
Akedo, J ;
Lebedev, M .
APPLIED PHYSICS LETTERS, 2000, 77 (11) :1710-1712
[2]   ELECTRICAL-PROPERTIES MAXIMA IN THIN-FILMS OF THE LEAD ZIRCONATE LEAD TITANATE SOLID-SOLUTION SYSTEM [J].
CHEN, HD ;
UDAYAKUMAR, KR ;
GASKEY, CJ ;
CROSS, LE .
APPLIED PHYSICS LETTERS, 1995, 67 (23) :3411-3413
[3]  
DI XH, 1997, JPN J APPL PHYS, V364, P5580
[4]   Crystal orientation dependence of piezoelectric properties of lead zirconate titanate near the morphotropic phase boundary [J].
Du, XH ;
Zheng, JH ;
Belegundu, U ;
Uchino, K .
APPLIED PHYSICS LETTERS, 1998, 72 (19) :2421-2423
[5]   High-piezoelectric behavior of c-axis-oriented lead zirconate titanate thin films with composition near the morphotropic phase boundary [J].
Fu, DS ;
Suzuki, H ;
Ogawa, T ;
Ishikawa, K .
APPLIED PHYSICS LETTERS, 2002, 80 (19) :3572-3574
[6]   Preferred orientations and microstructure of MgO films prepared by plasma-enhanced metalorganic chemical vapor deposition [J].
Fujii, E ;
Tomozawa, A ;
Torii, H ;
Takayama, R ;
Nagaki, M ;
Narusawa, T .
THIN SOLID FILMS, 1999, 352 (1-2) :85-90
[7]   Preparation of c-axis oriented Pb(Zr, Ti)O-3 thin films by RF-magnetron sputtering and their dielectric and piezoelectric properties [J].
Fujii, S ;
Kanno, I ;
Kamada, T ;
Takayama, R .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (9B) :6065-6068
[8]   PREPARATION OF LA-MODIFIED PBTIO3 THIN-FILMS ON THE OXIDE BUFFER LAYERS WITH NACL-TYPE STRUCTURE [J].
FUJII, S ;
TOMOZAWA, A ;
FUJII, E ;
TORII, H ;
TAKAYAMA, R ;
HIRAO, T .
APPLIED PHYSICS LETTERS, 1994, 65 (11) :1463-1465
[9]  
Hiboux S, 1999, FERROELECTRICS, V224, P743, DOI 10.1080/00150199908210582
[10]  
Jaffe B., 1971, PIEZOELECTRIC CERAMI