Physics-based simulation models for EBSD: advances and challenges

被引：23

作者：

Winkelmann, A. ^{[1
]}

Nolze, G. ^{[2
]}

Vos, M. ^{[3
]}

Salvat-Pujol, F. ^{[4
]}

Werner, W. S. M. ^{[4
]}

机构：

[1] Bruker Nano GmbH, Studio 2D, D-12489 Berlin, Germany

[2] Fed Inst Mat Res & Testing, BAM, Unter Eichen 87, D-12205 Berlin, Germany

[3] Australian Natl Univ, Res Sch Phys & Engn, Atom & Mol Phys Labs, Canberra, ACT 0200, Australia

[4] Vienna Univ Technol, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria

来源：

14TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS (EMAS 2015 WORKSHOP) | 2016年 / 109卷

关键词：

ELECTRON BACKSCATTER DIFFRACTION; ELASTIC STRAIN-MEASUREMENT; CHANNELING PATTERNS; KIKUCHI DIFFRACTION; FRIEDEL LAW; ORIENTATION; RESOLUTION; MICROSCOPY; PRINCIPLES; BREAKDOWN;

D O I：

10.1088/1757-899X/109/1/012018

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

EBSD has evolved into an effective tool for microstructure investigations in the scanning electron microscope. The purpose of this contribution is to give an overview of various simulation approaches for EBSD Kikuchi patterns and to discuss some of the underlying physical mechanisms.

引用

页数：13

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