Nondestructive elastic property measurements have been performed on Te nanowires with diameters in the range 20-150 nm. By using contact resonance atomic force microscopy, the elastic indentation modulus perpendicular to the prismatic facets of the nanowires has been accurately quantified. In this diameter range, a pronounced size dependence of the modulus has been observed: an invariant value consistent with Te bulk properties for large wire diameters, followed by a nonlinear increase with decreasing diameter, and finally an almost doubling of the modulus for Te nanowires thinner than 30 nm. A model based on surface stiffening describes the observations. (C) 2008 American Institute of Physics.
机构:Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
Kulkarni, AJ
;
Zhou, M
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Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
Zhou, M
;
Ke, FJ
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机构:Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
机构:Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
Kulkarni, AJ
;
Zhou, M
论文数: 0引用数: 0
h-index: 0
机构:
Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
Zhou, M
;
Ke, FJ
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h-index: 0
机构:Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA