Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy

被引：37
作者：
Gucciardi, P. G. [1 ]
Lopes, M. [2 ]
Deturche, R. [2 ]
Julien, C. [2 ]
Barchiesi, D. [2 ]
de la Chapelle, M. Lamy [2 ]
机构：
[1] Ist Proc Chim Fis, CNR, Sez Messina, I-98158 Messina, Italy
[2] Univ Technol Troyes, Lab Nanotechnol & Instrument Opt, CNRS, Inst Charles Delaunay,FRE 2848, F-10010 Troyes, France
来源：
NANOTECHNOLOGY | 2008年 / 19卷 / 21期
关键词：
D O I：
10.1088/0957-4484/19/21/215702
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We have investigated the depolarization effects of light scattered by sharp tips used for apertureless near-field optical microscopy. Dielectric and metal coated tips have been investigated and depolarization factors between 5 and 30% have been measured, changing as a function of the incident light polarization and of the tip shape. The experimental results are in good agreement with theoretical calculations performed by the finite element method, giving a near-field depolarization factor close to 10%. The effect of depolarization has been investigated in polarized tip-enhanced Raman spectroscopy (TERS) experiments; the depolarization gives rise to forbidden Raman modes in Si crystals.
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页数：7
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