A quasi-SOI power MOSFET for radio frequency applications formed by reversed silicon wafer direct bonding

被引:9
作者
Matsumoto, S [1 ]
Hiraoka, Y
Sakai, T
Yachi, T
Ishiyama, T
Kosugi, T
Kamitsuna, H
Muraguchi, M
机构
[1] NTT, Telecommun Energy Labs, Kanagawa 2430198, Japan
[2] NTT Adv Technol, Tokyo 1630430, Japan
[3] NTT, Photon Labs, Kanagawa 2430198, Japan
[4] NTT Elect, Kanagawa 2430198, Japan
关键词
power MOSFET; SOI technology;
D O I
10.1109/16.930665
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A quasi-SOH power MOSFET for radio frequency (RF) applications was fabricated by reversed silicon wafer direct bonding (RSDB), Its breakdown voltage was more than twice that of the conventional SOI power MOSFET and its other de characteristics were almost the same. Its maximum oscillation frequency was about 15% higher than that of the conventional SOI power MOSFET, The power-added efficiency (PAE) of the quasi- SOI power MOSFET was higher than the SOP one. It showed excellent PAE of 68% at a drain bias of 3.6 V.
引用
收藏
页码:1448 / 1453
页数:6
相关论文
共 9 条
[1]   A SOI-RF-CMOS technology on high resistivity SIMOX substrates for microwave applications to 5 GHz [J].
Eggert, D ;
Huebler, P ;
Huerrich, A ;
Kueck, H ;
Budde, W ;
Vorwerk, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (11) :1981-1989
[2]   MICROX (TM) - AN ALL-SILICON TECHNOLOGY FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS [J].
HANES, MH ;
AGARWAL, AK ;
OKEEFFE, TW ;
HOBGOOD, HM ;
SZEDON, JR ;
SMITH, TJ ;
SIERGIEJ, RR ;
MCMULLIN, PG ;
NATHANSON, HC ;
DRIVER, MC ;
THOMAS, RN .
IEEE ELECTRON DEVICE LETTERS, 1993, 14 (05) :219-221
[3]   A novel high-speed quasi-SOI power MOSFET with suppressed parasitic bipolar effect fabricated by reversed silicon wafer direct bonding [J].
Matsumoto, S ;
Yachi, T ;
Horie, H ;
Arimoto, Y .
IEDM - INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST 1996, 1996, :949-951
[4]   Thin-film quasi-SOI power MOSFET fabricated by reversed silicon wafer direct bonding [J].
Matsumoto, S ;
Yachi, T ;
Horie, H ;
Arimoto, Y .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (01) :105-109
[5]   Study on the device characteristics of a quasi-SOI power MOSFET fabricated by reversed silicon wafer direct bonding [J].
Matsumoto, S ;
Hiraoka, Y ;
Ishiyama, T ;
Sakai, T ;
Yachi, T ;
Yamada, I ;
Ito, A ;
Arimoto, Y .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (09) :1940-1945
[6]  
Nakamura S, 1995, INTERNATIONAL ELECTRON DEVICES MEETING, 1995 - IEDM TECHNICAL DIGEST, P889, DOI 10.1109/IEDM.1995.499359
[7]   High efficiency 2 GHz power Si-MOSFET design under low supply voltage down to 1V [J].
Ohguro, T ;
Saito, M ;
Morifuji, E ;
Murakami, K ;
Masuzaki, K ;
Yoshitomi, T ;
Morimoto, T ;
Momose, HS ;
Katsumata, Y ;
Iwai, H .
IEDM - INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST 1996, 1996, :83-86
[8]  
Voinigescu SP, 1995, INTERNATIONAL ELECTRON DEVICES MEETING, 1995 - IEDM TECHNICAL DIGEST, P721, DOI 10.1109/IEDM.1995.499320
[9]   A highly efficient 1.9-GHz Si high-power MOS amplifier [J].
Yoshida, I ;
Katsueda, M ;
Maruyama, Y ;
Kohjiro, I .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (04) :953-956