Dissolution and Precipitation of Ag3Sn Plates in Ultra Fine Solder Joints Using Synchrotron Radiation Real-time Imaging Technology

被引:0
作者
Huang, Mingliang [1 ]
Yang, Fan [1 ]
Zhao, Ning [1 ]
Zhang, Fei [1 ]
机构
[1] Dalian Univ Technol, Sch Mat Sci & Engn, Lab Elect Packaging Mat, Dalian 116024, Peoples R China
来源
2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT) | 2013年
关键词
intermetallic compound (IMC); Ag3Sn plate; undercooling; synchrotron radiation; precipitation; LEAD-FREE SOLDERS; INTERMETALLIC COMPOUNDS; COMPOUND;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the continuous miniaturization of solder joints, the formation of large Ag3Sn plates in Ag containing solders has a detrimental effect on the reliability of solder joints. In the present work, synchrotron radiation real-time in situ imaging technology was used to study the dissolution and precipitation behavior of Ag3Sn plates, as well as the undercooling of Ag3Sn plates and the solder balls, in Sn-4.0Ag-0.5Cu/Ni-P solder joints with a diameter of 45 mu m. The precipitation temperature of Ag3Sn plates was in the range of 160-202 degrees C and the undercooling was in the range of 15-57 degrees C. The undercooling of small solder balls was in the range of 29-63 degrees C, which was slightly larger than that of Ag3Sn plates. Once nucleated, Ag3Sn plates rapidly precipitated at the interface within 2 s, and the precipitation rate was estimated to be at least 5 mu m/s. The dissolution rate of Ag3Sn plate was significantly slower than the precipitation rate. It took about 40 s for Ag3Sn plates to dissolve into the molten solder, and the dissolution rate was estimated to be 1 mu m/s. Synchrotron radiation real-time in situ imaging technology provides a direct way to observe the microstructural evolution and measure the undercooling of Ag3Sn plates and solder bumps.
引用
收藏
页码:822 / 825
页数:4
相关论文
共 14 条
  • [1] Formation of Ag3Sn plates in SnAgCu solder bumps
    Gong, Jicheng
    Liu, Changqing
    Conway, Paul P.
    Silberschmidt, Vadim V.
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2010, 527 (10-11): : 2588 - 2591
  • [2] Huang M. L., 2007, INT S HIGH DENS PACK, P145
  • [3] Ag3Sn plate formation in the solidification of near-ternary eutectic Sn-Ag-Cu
    Kang, SK
    Choi, WK
    Shih, DY
    Henderson, DW
    Gosselin, T
    Sarkhel, A
    Goldsmith, C
    Puttlitz, KJ
    [J]. JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2003, 55 (06): : 61 - 65
  • [4] Effect of thermal cycles on the mechanical strength of quad flat pack leads/Sn-3.5Ag-X (X = Bi and Cu) solder joints
    Kariya, Y
    Hirata, Y
    Otsuka, M
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1999, 28 (11) : 1263 - 1269
  • [5] Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
    Kim, KS
    Huh, SH
    Suganuma, K
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2003, 352 (1-2) : 226 - 236
  • [6] Effects of cooling speed on microstructure and tensile properties of Sn-Ag-Cu alloys
    Kim, KS
    Huh, SH
    Suganuma, K
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 333 (1-2): : 106 - 114
  • [7] Mechanical and electronic properties of Ag3Sn intermetallic compound in lead free solders using ab initio atomistic calculation
    Kumar, Santosh
    Jung, JaePil
    [J]. MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2013, 178 (01): : 10 - 21
  • [8] Evolution of Ag3Sn at Sn-3.0Ag-0.3Cu-0.05Cr/Cu joint interfaces during thermal aging
    Lin, Fei
    Bi, Wenzhen
    Ju, Guokui
    Wang, Wurong
    Wei, Xicheng
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2011, 509 (23) : 6666 - 6672
  • [9] Effect of Sn grain orientation on electromigration degradation mechanism in high Sn-based Pb-free solders
    Lu, Minhua
    Shih, Da-Yuan
    Lauro, Paul
    Goldsmith, Charles
    Henderson, Donald W.
    [J]. APPLIED PHYSICS LETTERS, 2008, 92 (21)
  • [10] In-situ study on growth behavior of Ag3Sn in Sn-3.5Ag/Cu soldering reaction by synchrotron radiation real-time imaging technology
    Ma, H. T.
    Qu, L.
    Huang, M. L.
    Gu, L. Y.
    Zhao, N.
    Wang, L.
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2012, 537 : 286 - 290