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- [2] COMPARISON OF DEPTH PROFILES BETWEEN ION MICROPROBE MASS ANALYZER AND SCANNING AUGER MICROPROBE TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1985, 71 (05): : S425 - S425
- [4] ION MICROPROBE MEASUREMENTS OF CONCENTRATION DEPTH PROFILES OF ERBIUM OXIDE ON THIN-FILM ERBIUM METAL JOURNAL OF THE LESS-COMMON METALS, 1973, 30 (02): : 317 - 320
- [5] PROBLEMS IN ELEMENTAL CONCENTRATION DEPTH PROFILING WITH AN ION MICROPROBE INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1978, 26 (02): : 163 - 172
- [7] DEPTH PROFILING BY ION MICROPROBE WITH HIGH MASS RESOLUTION INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 29 (04): : 351 - 361
- [10] ELECTRONIC APERTURE FOR IN-DEPTH ANALYSIS OF SOLIDS WITH AN ION MICROPROBE INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1976, 19 (03): : 327 - 334