Direct Deposition of (BixSb1-x)2Te3 Nanosheets on Si/SiO2 Substrates by Chemical Vapor Transport

被引:2
|
作者
Hansen, Felix [1 ]
Fucke, Rico [1 ]
Charvin, Titouan [1 ]
Froeschke, Samuel [1 ]
Wolf, Daniel [1 ]
Giraud, Romain [1 ,2 ]
Dufouleur, Joseph [1 ]
Graessler, Nico [1 ]
Buechner, Bernd [1 ,3 ]
Schmidt, Peer [4 ]
Hampel, Silke [1 ]
机构
[1] Leibniz Inst Solid State & Mat Res Dresden, D-01069 Dresden, Germany
[2] Univ Grenoble Alpes, CNRS, CEA, Grenoble INP,SPINTEC, F-38000 Grenoble, France
[3] Tech Univ Dresden, D-01069 Dresden, Germany
[4] Brandenburg Univ Technol Cottbus Senftenberg, D-01968 Senftenberg, Germany
关键词
BISMUTH TELLURIDE; TOPOLOGICAL INSULATORS; CRYSTAL-STRUCTURE; BI2TE3; DEFECTS; SB2TE3; BI2SE3;
D O I
10.1021/acs.cgd.1c01446
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The tellurides of bismuth and antimony (Bi2Te3 and Sb2Te3) are prominent members of the V2VI3 material family that exhibit promising topological properties. We provide a method for the rational synthesis of mixed crystals of these materials ((BixSb1-x)(2)Te-3 with x = 0.1,..., 0.9) by means of a bottom-up chemical vapor transport (CVT) approach. Thermodynamic calculations showed the synthesis to be possible in the temperature range of 390-560 degrees C without significant enrichment of either component and without adding a transport agent. The starting materials were synthesized and verified by X-ray diffraction (XRD). Optimization experiments showed the ideal conditions for nanosheet synthesis to be T-2 = 560 degrees C, T-1 = 390 degrees C with a reaction time of t = 36 h. Crystals with heights of down to 12 nm (12 quintuple layers) were syntheszed and analyzed by means of scanning electron microscopy, energy-dispersive X-ray spectrometry, and atomic force microscopy. High-resolution transmission electron microscopy confirmed the R (3) over barm crystal structure, high crystallinity, and overall quality of the synthesized (BixSb1-x)(2)Te-3 nanosheets. Magnetotransport measurements revealed that such ternary compounds can have a significantly reduced carrier density compared to the binary parent compounds.
引用
收藏
页码:2354 / 2363
页数:10
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